Abstract: A method and system for supplying control signals to two or more force actuators wherein each of the two or more force actuators having a defined force value. The method includes sending a first set of control signals to each of the actuators to ramp forces supplied to reach the defined force value at a same initial defined value time and sending a second set of control signals to each of the actuators to reduce the forces supplied starting at a same final defined value time to individual set point values, and wherein each of the two of more force actuators reach their individual set point values at a same set point time.

Abstract: A method and system for supplying control signals to two or more force actuators wherein each of the two or more force actuators having a defined force value. The method includes sending a first set of control signals to each of the actuators to ramp forces supplied to reach the defined force value at a same initial defined value time and sending a second set of control signals to each of the actuators to reduce the forces supplied starting at a same final defined value time to individual set point values, and wherein each of the two of more force actuators reach their individual set point values at a same set point time.

Abstract: A method for identifying a model for modeling cable stress relaxation dynamics of an imprint head is provided. The method includes performing a non-contact imprint test run for a predetermined number of wafers. Data from a force trace and a position trace of the imprint head during the non-contact imprint test run are collected to compute cable stress relaxation forces. A model having a plurality of different model orders is generated. A set of parameters of the model for each model order is identified. Residual sum of squares for wafer average error for each of the model orders is calculated based on the obtained cable stress relaxation forces. The set of parameters of one of the plurality of model orders may be based on a difference in the residual sum of squares for wafer average error between the one of the plurality of model orders and a next higher model.

Abstract: A method and system for supplying control signals to two or more force actuators wherein each of the two or more force actuators having a defined force value. The method includes sending a first set of control signals to each of the actuators to ramp forces supplied to reach the defined force value at a same initial defined value time and sending a second set of control signals to each of the actuators to reduce the forces supplied starting at a same final defined value time to individual set point values, and wherein each of the two of more force actuators reach their individual set point values at a same set point time.