Patents by Inventor Jeffrey Diep

Jeffrey Diep has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Mass spectrometer for trace gas leak detection with suppression of undesired ions
    Patent number: 7459677
    Abstract: Mass spectrometers for trace gas leak detection and methods for operating mass spectrometers are provided. The mass spectrometer includes an ion source to ionize trace gases, such as helium, a magnet to deflect the ions and a detector to detect the deflected ions. The ion source includes an electron source, such a filament. The method includes operating the electron source at an electron accelerating potential relative to an ionization chamber sufficient to ionize the trace gas but insufficient to form undesired ions, such as triply charged carbon.
    Type: Grant
    Filed: February 15, 2006
    Date of Patent: December 2, 2008
    Assignee: Varian, Inc.
    Inventors: J. Daniel Geist, Jeffrey Diep, Peter Williams, Charles W. Perkins
  • High sensitivity slitless ion source mass spectrometer for trace gas leak detection
    Patent number: 7427751
    Abstract: A mass spectrometer includes a main magnet having spaced-apart polepieces which define a gap, the main magnet producing a magnetic field in the gap, an ion source to generate ions and to accelerate the ions into the magnetic field in the gap, the ion source located outside the gap, and an ion detector to detect a selected species of the ions generated by the ion source and deflected by the magnetic field. The ion detector is located in the gap at a natural focus point of the selected species of ions. The mass spectrometer may be used in a trace gas leak detector.
    Type: Grant
    Filed: February 15, 2006
    Date of Patent: September 23, 2008
    Assignee: Varian, Inc.
    Inventors: J. Daniel Geist, Jeffrey Diep, Peter Williams, Charles W. Perkins
  • Mass spectrometer for trace gas leak detection with suppression of undesired ions
    Publication number: 20070187586
    Abstract: Mass spectrometers for trace gas leak detection and methods for operating mass spectrometers are provided. The mass spectrometer includes an ion source to ionize trace gases, such as helium, a magnet to deflect the ions and a detector to detect the deflected ions. The ion source includes an electron source, such a filament. The method includes operating the electron source at an electron accelerating potential relative to an ionization chamber sufficient to ionize the trace gas but insufficient to form undesired ions, such as triply charged carbon.
    Type: Application
    Filed: February 15, 2006
    Publication date: August 16, 2007
    Inventors: J. Geist, Jeffrey Diep, Peter Williams, Charles Perkins
  • High sensitivity slitless ion source mass spectrometer for trace gas leak detection
    Publication number: 20070187592
    Abstract: A mass spectrometer includes a main magnet having spaced-apart polepieces which define a gap, the main magnet producing a magnetic field in the gap, an ion source to generate ions and to accelerate the ions into the magnetic field in the gap, the ion source located outside the gap, and an ion detector to detect a selected species of the ions generated by the ion source and deflected by the magnetic field. The ion detector is located in the gap at a natural focus point of the selected species of ions. The mass spectrometer may be used in a trace gas leak detector.
    Type: Application
    Filed: February 15, 2006
    Publication date: August 16, 2007
    Inventors: J. Geist, Jeffrey Diep, Peter Williams, Charles Perkins