Patents by Inventor Jeffrey Frank Kutner

Jeffrey Frank Kutner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus for functional and stress testing of exposed chip land grid array devices
    Patent number: 6911836
    Abstract: A chip testing system with improved thermal performance. In a preferred embodiment, a nest assembly of a chip testing apparatus includes tooling balls and a fitted frame for improving alignment of a coldplate and a chip surface. In preferred embodiments, the coldplate is of unibody design. Thermal performance is also improved by balancing the forces exerted on the coldplate using an adjustable hose mounting bracket. The bracket allows the forces exerted by the hoses on the coldplate to be adjusted so they balance and cancel other unwanted forces on the cold plate.
    Type: Grant
    Filed: August 21, 2003
    Date of Patent: June 28, 2005
    Assignee: International Business Machines Corporation
    Inventors: Lonnie J. Cannon, John Saunders Corbin, Jr., David Lewis Gardell, Jose Arturo Garza, Jeffrey Frank Kutner, Kenneth Carl Larsen, Howard Victor Mahaney, Jr., John Joseph Salazar