Abstract: The present invention provides a light device comprised of a body, a handle, a user interface, and a positionable arm that is structured to pivotally support a lighting element assembly. The light device may be configured to be portable and carried or otherwise manipulated by a user grasping the handle. In one embodiment, the body of the light device defines first and second support surfaces that are structured to stably support the weight of the light device in first and second illumination positions, respectively.

Abstract: The present invention is directed to a device for illuminating a yard sign that uses an efficient beam of light and is adapted to cycle on and off. The illuminating device includes a main body portion, a switch, a control circuit, a power source, at least one arm adjustably attached to the main body portion, and a light head disposed proximate an end of the at least one arm, the light head comprising at least one light emitting diode (LED) assembly. The control circuit is configured to automatically cycle the LED assembly on and off when activated by the switch.

Abstract: The present invention provides a light device comprised of a body, a handle, a user interface, and a positionable arm that is structured to pivotally support a lighting element assembly. The light device may be configured to be portable and carried or otherwise manipulated by a user grasping the handle. In one embodiment, the body of the light device defines first and second support surfaces that are structured to stably support the weight of the light device in first and second illumination positions, respectively.

Abstract: Telephone line distribution apparatus are provided that permit easy user-selection of primary and secondary telephone lines without requiring physical rewiring of RJ plugs or receptacles. A telephone line distribution apparatus includes a first RJ connector, one or more second RJ connectors, and a switching device that allows a subscriber to designate which of a plurality of incoming telephone lines is the subscriber's primary line and secondary line. A switching device has various user-selectable configurations. When in a first configuration, a first incoming telephone line becomes the subscriber primary telephone line at one or more of the second RJ connectors. When the switching device is in a second configuration, a second incoming telephone line becomes the subscriber primary telephone line at one or more of the second RJ connectors. Additional incoming telephone lines can be designated as primary or secondary telephone lines in a similar manner.

Abstract: A method and apparatus for mounting an electronic component within a housing is provided comprising a modular equipment rack bracket for electronic equipment including a first and second mounting bracket arm for mounting to a housing rack assembly and a frame member for supporting a plurality of electrical supply cabling, signal cabling or data cabling and the like. The first and second mounting bracket arms are affixed to the front of the housing rack assembly and have associated therewith a plurality of fastener openings for attaching electronic components thereto. The frame member is coupled to one of a plurality of coupling means of the first and second mounting bracket arms allowing the electronic component to be affixed to the mounting bracket in either a front-facing forward configuration or a rear-facing forward configuration without removing the affixed first and second mounting bracket arms from the rack housing assembly.

Abstract: According to the preferred embodiments of the present invention, a method of creating and accessing additional test points after circuit board design has been completed is disclosed. The apparatus and methods of the present invention provide test engineers with the ability to leave any circuit interconnections located on the exterior surfaces of a PCB exposed. These exposed circuit interconnections may be identified as access or test points and the apparatus of the present invention is specifically adapted to access, probe, and evaluate these access or test points. To allow the exposed circuit interconnections to be tested without damaging them, the invention includes a new type of probe for use in contacting the exposed traces. The preferred embodiments of the test probe apparatus of the present invention has a relatively flat head to reduce pressure on the circuit interconnections and is coated with dendrites to enhance electrical connectivity between the circuit interconnections and the probe.

Abstract: According to the preferred embodiments of the present invention, a method of creating and accessing additional test points after circuit board design has been completed is disclosed. The apparatus and methods of the present invention provide test engineers with the ability to leave any circuit interconnections located on the exterior surfaces of a PCB exposed. These exposed circuit interconnections may be identified as access or test points and the apparatus of the present invention is specifically adapted to access, probe, and evaluate these access or test points. To allow the exposed circuit interconnections to be tested without damaging them, the invention includes a new type of probe for use in contacting the exposed traces. The preferred embodiments of the test probe apparatus of the present invention has a relatively flat head to reduce pressure on the circuit interconnections and is coated with dendrites to enhance electrical connectivity between the circuit interconnections and the probe.

Abstract: According to the preferred embodiments of the present invention, a method of creating and accessing additional test points after circuit board design has been completed is disclosed. The apparatus and methods of the present invention provide test engineers with the ability to leave any circuit interconnections located on the exterior surfaces of a PCB exposed. These exposed circuit interconnections may be identified as access or test points and the apparatus of the present invention is specifically adapted to access, probe, and evaluate these access or test points. To allow the exposed circuit interconnections to be tested without damaging them, the invention includes a new type of probe for use in contacting the exposed traces. The preferred embodiments of the test probe apparatus of the present invention has a relatively flat head to reduce pressure on the circuit interconnections and is coated with dendrites to enhance electrical connectivity between the circuit interconnections and the probe.

Abstract: A test fixture for testing circuit boards includes a field of upwardly projecting test probes. The circuit board to be tested includes a plurality of test points to be contacted by a corresponding test probe. The circuit board is fixed to a floating guide plate having apertures therethrough aligned with the test points. As the floating guide plate is lowered over the test probes the guide plate is permitted to float in a lateral direction to achieve proper alignment between the probes and the apertures. Once aligned, the probes continue to pass through the apertures to make contact with their respective test points.