Abstract: A holder for a flat substrate, such as for example a semiconductor wafer or a glass slide, has a fixture with a sample insertion groove for holding the flat substrate, or multiple sample insertion grooves for holding multiple flat substrates. The fixture also has a channel milled perpendicular to the sample insertion groove. The channel may be machined such that two portions of the channel open to opposite sides of the fixture. Positioned in the channel of the fixture is a cantilever spring for securing the flat substrate in the sample insertion groove. The channel may contain a single cantilever spring that extends an entire length of the channel, or multiple cantilever springs. The fixture may include a post, dove tail, screw, or clamp for mounting the holder on a stage inside a vacuum chamber of an instrument.

Abstract: A holder for a flat substrate, such as for example a semiconductor wafer or a glass slide, has a fixture with a sample insertion groove for holding the flat substrate, or multiple sample insertion grooves for holding multiple flat substrates. The fixture also has a channel milled perpendicular to the sample insertion groove. The channel may be machined such that two portions of the channel open to opposite sides of the fixture. Positioned in the channel of the fixture is a cantilever spring for securing the flat substrate in the sample insertion groove. The channel may contain a single cantilever spring that extends an entire length of the channel, or multiple cantilever springs. The fixture may include a post, dove tail, screw, or clamp for mounting the holder on a stage inside a vacuum chamber of an instrument.

Abstract: Cryogenic manipulation of a material sample with an in situ probe is enabled with a novel cooled probe design. A material sample mounted on a cryo-stage in a vacuum chamber is cooled to a cryogenic temperature. In addition, a nano-manipulator probe inside the sample chamber is also cooled to cryogenic temperature. A specific sample site is milled in the chamber using a focused ion beam and attached to the cooled probe by vapor deposition. After releasing the sample, the sample site is attached to a destination surface such as a transmission electron microscope (TEM) grid and the probe is then detached from the sample using the focused ion beam.

Abstract: Cryogenic manipulation of a material sample with an in situ probe is enabled with a novel cooled probe design. A material sample mounted on a cryo-stage in a vacuum chamber is cooled to a cryogenic temperature. In addition, a nano-manipulator probe inside the sample chamber is also cooled to cryogenic temperature. A specific sample site is milled in the chamber using a focused ion beam and attached to the cooled probe by vapor deposition. After releasing the sample, the sample site is attached to a destination surface such as a transmission electron microscope (TEM) grid and the probe is then detached from the sample using the focused ion beam.