Abstract: Detection of event conditions in an industrial plant includes receiving process data corresponding to one or more sensors, estimating normal statistics from the process data, estimating abnormal statistics from the process data with potentially abnormal operation of the one or more components, determining a fault model from the estimated normal and abnormal statistics, the fault model including a learning matrix, one or more fault indices indicating a likelihood of an occurrence of one or more fault events, and a fault threshold corresponding to the one or more sensors, determining one or more further fault indices from the further process data; applying the fault threshold to the one or more further fault indices, and indicating a further occurrence of the one or more fault events when a magnitude of the one or more further fault indices exceeds the fault threshold corresponding to the one or more sensors.