Patents by Inventor Jeffrey M. Kresch

Jeffrey M. Kresch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10397565
    Abstract: Disclosed is an imaging device employing a measurement zone directed at a target, where the imaging device can be used in conjunction with a misalignment analysis feature. The imaging device can capture first and second images at different times. The first and second images may be compared, such as by comparing a location of the measurement zone of the imaging device in the first image with a location of the measurement zone of the imaging device in the second image. Based on the comparison, a misalignment indication of the imaging device relative to the target can be provided.
    Type: Grant
    Filed: March 19, 2018
    Date of Patent: August 27, 2019
    Assignee: Fluke Corporation
    Inventors: Jeffrey M. Kresch, Steffen Ludwig, Reno Gärtner
  • Publication number: 20180213221
    Abstract: Disclosed is an imaging device employing a measurement zone directed at a target, where the imaging device can be used in conjunction with a misalignment analysis feature. The imaging device can capture first and second images at different times. The first and second images may be compared, such as by comparing a location of the measurement zone of the imaging device in the first image with a location of the measurement zone of the imaging device in the second image. Based on the comparison, a misalignment indication of the imaging device relative to the target can be provided.
    Type: Application
    Filed: March 19, 2018
    Publication date: July 26, 2018
    Inventors: Jeffrey M. Kresch, Steffen Ludwig, Reno Gärtner
  • Publication number: 20180084246
    Abstract: Disclosed is an imaging device employing a measurement zone directed at a target, where the imaging device can be used in conjunction with a misalignment analysis feature. The imaging device can capture first and second images at different times. The first and second images may be compared, such as by comparing a location of the measurement zone of the imaging device in the first image with a location of the measurement zone of the imaging device in the second image. Based on the comparison, a misalignment indication of the imaging device relative to the target can be provided.
    Type: Application
    Filed: September 22, 2016
    Publication date: March 22, 2018
    Inventors: Jeffrey M. Kresch, Steffen Ludwig, Reno Gärtner
  • Patent number: 9924160
    Abstract: Disclosed is an imaging device employing a measurement zone directed at a target, where the imaging device can be used in conjunction with a misalignment analysis feature. The imaging device can capture first and second images at different times. The first and second images may be compared, such as by comparing a location of the measurement zone of the imaging device in the first image with a location of the measurement zone of the imaging device in the second image. Based on the comparison, a misalignment indication of the imaging device relative to the target can be provided.
    Type: Grant
    Filed: September 22, 2016
    Date of Patent: March 20, 2018
    Assignee: Fluke Corporation
    Inventors: Jeffrey M. Kresch, Steffen Ludwig, Reno Gärtner
  • Patent number: 5144122
    Abstract: A scanning radiation sensor (10) automatically focuses a focusable optical system (26) based on the closest distance (C) and the farthest distance (F) of the optical system (26) from a target (12) through means of a focusing controller (44), motor driver (42) and focus motor (40) to obtain an optimum focus for all points along a line between the farthest point (f) and closest point (c).
    Type: Grant
    Filed: October 19, 1990
    Date of Patent: September 1, 1992
    Assignee: Square D Company
    Inventors: William J. Danley, Jeffrey M. Kresch, Eugene F. Kalley
  • Patent number: 5085525
    Abstract: A solid state laser visible light source (26) passes light through a scanning mechanism (22) otherwise used to convey radiation from a target (12) to a detector (28) of a scanning radiation sensor (10) to mark with light a line (16) which is continuous when the sensor (10) is operating in a continuous mode, but when the sensor is operated in a spot mode in which a plurality of spots along a scan line are to be individually measured, a control (30) causes the light source to turn on and off at the correct times in the scan cycle to cause the light source (26) to mark the plural spots on the scan line (16). A CCD camera (40) with an automatic gain control circuit (46) is used in conjunction with a band pass light filter (36) to substantially enhance viewability of the image of the light markings (16) on the target (12) on a display (44).
    Type: Grant
    Filed: October 19, 1990
    Date of Patent: February 4, 1992
    Assignee: Square D Company
    Inventors: George Bartosiak, Sam Paris, Jeffrey M. Kresch, William J. Danley, Eugene F. Kalley, Arthur E. Goldberg