Patents by Inventor Jeffrey Marc Kletsky

Jeffrey Marc Kletsky has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6385237
    Abstract: Method and apparatus for non-invasive testing of digital communications systems. Amplitude measurements are made for multiple frequencies of a multi-frequency communication system, converted to the time domain. An adaptive filter output is matched to the time domain representation to characterize the channel. Impedance mismatches may be precisely located using this technique. An error signal representing a difference between a signal transmitted through the channel and a received signal is estimated and analyzed. The error signal is separated into components corresponding to contributions by wide band noise, residual phase modulation, and residual amplitude modulation. Identification and removal of narrow-band interferers may occur prior to this separation. Bit error rate and system margin computations employ a Monte Carlo simulation of the various error sources. This provides a well refined estimate of bit error rate and system margin.
    Type: Grant
    Filed: February 1, 2000
    Date of Patent: May 7, 2002
    Assignee: Wavetek Wandell and Goltermann
    Inventors: Ernest T. Tsui, Jeffrey Marc Kletsky
  • Patent number: 6278730
    Abstract: Method and apparatus for non-invasive testing of digital communications systems. Amplitude measurements are made for multiple frequencies of a multi-frequency communication system, converted to the time domain. An adaptive filter output is matched to the time domain representation to characterize the channel. Impedance mismatches may be precisely located using this technique. An error signal representing a difference between a signal transmitted through the channel and a received signal is estimated and analyzed. The error signal is separated into components corresponding to contributions by wide band noise, residual phase modulation, and residual amplitude modulation. Identification and removal of narrow-band interferers may occur prior to this separation. Bit error rate and system margin computations employ a Monte Carlo simulation of the various error sources. This provides a well refined estimate of bit error rate and system margin.
    Type: Grant
    Filed: September 30, 1999
    Date of Patent: August 21, 2001
    Assignee: Wavetek Wandell Goltermann
    Inventors: Ernest T. Tsui, Jeffrey Marc Kletsky
  • Patent number: 6233274
    Abstract: Method and apparatus for non-invasive testing of digital communications systems. Amplitude measurements are made for multiple frequencies of a multi-frequency communication system, converted to the time domain. An adaptive filter output is matched to the time domain representation to characterize the channel. Impedance mismatches may be precisely located using this technique. An error signal representing a difference between a signal transmitted through the channel and a received signal is estimated and analyzed. The error signal is separated into components corresponding to contributions by wide band noise, residual phase modulation, and residual amplitude modulation. Identification and removal of narrow-band interferers may occur prior to this separation. Bit error rate and system margin computations employ a Monte Carlo simulation of the various error sources. This provides a well refined estimate of bit error rate and system margin.
    Type: Grant
    Filed: September 30, 1999
    Date of Patent: May 15, 2001
    Assignee: Wavetek Wandel Goltermann
    Inventors: Ernest T. Tsui, Jeffrey Marc Kletsky
  • Patent number: 6061393
    Abstract: Method and apparatus for non-invasive testing of digital communications systems. Amplitude measurements are made for multiple frequencies of a multi-frequency communication system, converted to the time domain. An adaptive filter output is matched to the time domain representation to characterize the channel. Impedance mismatches may be precisely located using this technique. An error signal representing a difference between a signal transmitted through the channel and a received signal is estimated and analyzed. The error signal is separated into components corresponding to contributions by wide band noise, residual phase modulation, and residual amplitude modulation. Identification and removal of narrow-band interferers may occur prior to this separation. Bit error rate and system margin computations employ a Monte Carlo simulation of the various error sources. This provides a well refined estimate of bit error rate and system margin.
    Type: Grant
    Filed: January 30, 1997
    Date of Patent: May 9, 2000
    Assignee: Wavetek Wandel and Goltermann
    Inventors: Ernest T. Tsui, Jeffrey Marc Kletsky
  • Patent number: 5751766
    Abstract: Method and apparatus for non-invasively testing performance of a digital communication system. The test system finds particular application in digital broadcast systems where interruption of regular service for test purposes is impracticable. In one embodiment oriented to digital television cable broadcast systems, unwanted reflections due to loose connectors and other causes may be localized within a subscriber's home. The test system takes advantage of information typically generated by digital receivers to correct for communication channel imperfections. Examples of such information include current filter parameters computed for use in an internal adaptive equalizer, internal loop parameters, and the difference between the signal received and a reconstruction of that signal from the symbols estimated by the receiver.
    Type: Grant
    Filed: September 21, 1995
    Date of Patent: May 12, 1998
    Assignee: Applied Signal Technology, Inc.
    Inventors: Jeffrey Marc Kletsky, Ernest T. Tsui