Abstract: To address non-linearity, an on-chip linearization scheme is implemented along with an analog-to-digital converter (ADC) to measure and correct/tune for non-linearities and/or other non-idealities of the signal path having the ADC. The on-chip linearization scheme involves generating one or more test signals using an on-chip digital-to-analog converter (DAC) and providing the one or more test signals as input to the signal path to be linearized, and estimating non-linearity based on the one or more test signals and the output of the ADC. Test signals can include single-tone signals, multi-tone signals, and wideband signals spread over a range of frequencies. A time-delayed interleaving clocking scheme can be used to achieve a higher data rate for coefficient estimation without having to increase the sample rate of the ADC.

Abstract: To address non-linearity, an on-chip linearization scheme is implemented along with an analog-to-digital converter (ADC) to measure and correct/tune for non-linearities and/or other non-idealities of the signal path having the ADC. The on-chip linearization scheme involves generating one or more test signals using an on-chip digital-to-analog converter (DAC) and providing the one or more test signals as input to the signal path to be linearized, and estimating non-linearity based on the one or more test signals and the output of the ADC. Test signals can include single-tone signals, multi-tone signals, and wideband signals spread over a range of frequencies. A time-delayed interleaving clocking scheme can be used to achieve a higher data rate for coefficient estimation without having to increase the sample rate of the ADC.

Abstract: A method and a corresponding device for performing a background calibration of a comparator in a circuit having a plurality of stages that are connected in a pipelined fashion to an input signal. A digital value of a residue signal, which is output from a first stage in the plurality of stages to a subsequent stage in the plurality of stages, is calculated. The value of the residue signal is compared to at least one threshold. Based on the comparison, a triggering threshold of a selected comparator in the first stage may be adjusted.

Abstract: A method and a corresponding device for performing a background calibration of a comparator in a circuit having a plurality of stages that are connected in a pipelined fashion to an input signal. A digital value of a residue signal, which is output from a first stage in the plurality of stages to a subsequent stage in the plurality of stages, is calculated. The value of the residue signal is compared to at least one threshold. Based on the comparison, a triggering threshold of a selected comparator in the first stage may be adjusted.

Abstract: A phase locked loop (PLL) (40) simultaneously has both relatively-low power consumption and relatively-low jitter on a clock output signal. The PLL (40) includes a phase detector (41) and a phase error accumulator (42) connected to the output of the phase detector (41). The phase error accumulator (42) samples an output of the phase detector (41) at a relatively-high clock rate, but accumulates these samples and provides an output thereof to a loop filter (43) at a relatively-low clock rate. Thus the PLL (40) captures short periods of phase delay to maintain low clock output signal jitter, while at the same time, however, the loop filter (43) need only adjust its output periodically, at the relatively-low rate, thereby saving power. The phase detector (41) detects a metastable condition on a phase detector latch (60) and resolves to an up pulse or a down pulse to further reduce clock output signal jitter.