Abstract: A mass interconnect device having a receiver and test adapter, each having a plurality of modules, pins and patchcords connected thereto. The receiver has an independent rotatable engagement lever attached at each side for drawing a test adapter into engagement with the receiver. Each engagement lever has dual cams that mate with a slot in an engagement plate on each side of the test adapter, thereby permitting the pair to provide four-point pull-down of the test adapter into the receiver.

Abstract: A scalable mass interconnect device having a receiver assembly with module mounting members positioned in the receiver frame in a direction parallel to a plane of movement of the engagement cams in the receiver. Modules are mounted in the module mounting members such that the modules are perpendicular to a plane of movement of the engagement cams in the receiver.

Abstract: An electrical test probe assembly for loaded board testing includes a housing having a hollow interior, and first and second opposite shields positioned and axially slidable in the housing and outwardly biased against each other. The first and second opposite shields form first and second shield cavities, respectively. In addition, the electrical test probe assembly includes first and second opposite insulators positioned and axially slidable in the first and second shield cavities, respectively. The first and second opposite insulators form an insulator cavity extending along the housing. Finally, the electrical test probe assembly includes first and second opposite plungers positioned and axially slidable in the insulator cavity of the first and second opposite insulators and outwardly biased against each other.

Abstract: An electrical test probe assembly for loaded board testing includes a housing having a hollow interior, and first and second opposite shields positioned and axially slidable in the housing and outwardly biased against each other. The first and second opposite shields form first and second shield cavities, respectively. In addition, the electrical test probe assembly includes first and second opposite insulators positioned and axially slidable in the first and second shield cavities, respectively. The first and second opposite insulators form an insulator cavity extending along the housing. Finally, the electrical test probe assembly includes first and second opposite plungers positioned and axially slidable in the insulator cavity of the first and second opposite insulators and outwardly biased against each other.

Abstract: A connection interface system positions and electrically connects a testing device to a device under test. The testing device exercises and tests the device under test. The connection interface system includes a receiver module electrically connected to the device under test and including receiver electrical connectors. The receiver module includes a top frame and a bottom frame, movable with respect to the top frame and operatively connected thereto. The bottom frame includes at least one receiver module having at least one receiver electrical connector. The receiver module further includes an engagement mechanism movably connected to the bottom frame and to the top frame which either engages or disengages the bottom frame and the top frame in response to an external stimulus to engage or disengage receiver electrical connectors in the bottom frame to external electrical connectors.

Abstract: An electrical test probe assembly for loaded board testing includes a housing having a hollow interior, and first and second opposite shields positioned and axially slidable in the housing and outwardly biased against each other. The first and second opposite shields form first and second shield cavities, respectively. In addition, the electrical test probe assembly includes first and second opposite insulators positioned and axially slidable in the first and second shield cavities, respectively. The first and second opposite insulators form an insulator cavity extending along the housing. Finally, the electrical test probe assembly includes first and second opposite plungers positioned and axially slidable in the insulator cavity of the first and second opposite insulators and outwardly biased against each other.

Abstract: An electronic equipment enclosure includes a card cage for holding a plurality of electronic instrumentation circuit cards. Interface adapters are mounted on the front panels of each of the circuit cards to provide external connections to respective ones of the circuit cards through a connector module at the front end of each interface adapter. A pair of positioning pins are mounted on the front of each interface adapter on opposite sides of the respective connector module. A receiver is hinged to the front of the enclosure and includes upper and lower frames having a series of holes therethrough in correspondence with respective ones of the alignment pins. When the receiver is placed in an upright closed position, the alignment pins engage respective ones of the holes to accurately position the front of each adapter module and corresponding connector module which extend into a module access space between the frames.

Abstract: A simplified and more economical manufacturing method for the contact head of a spring contact probe is disclosed. Only two passes of a machining tool across the axis of the contact head on orthogonal axes produces a center pyramid contact point, two pairs of surrounding chisel points, and two pairs of contact points in the spaces between the chisel points formed from metal remaining after the two machining passes.

Abstract: For in-circuit and functional testing of loaded printed circuit boards with speed and precision, a vacuum-actuated test fixture utilizes a yielding diaphragm assembly with rigid frame and spring-loaded diaphragm base plate, to distribute downward atmospheric pressure evenly over the entire area of the board without localized stress concentrations. A captive removable diaphragm frame and quick-acting spring-loaded cam latches assure a positive seal around the margin of the diaphragm assembly and along top and bottom edge portions thereof. Ease of assembly and disassembly is promoted. A plug-in vacuum adapter with manual valve provides quick hook-up of the test fixture to a vacuum source. A lower base frame and patchboard assembly allow efficient interfacing of the text fixture with a suitable receiver frame of test apparatus.