Patents by Inventor Jeffrey S. McMurray

Jeffrey S. McMurray has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Transmission electron microscopy sample preparation method for electron holography
    Patent number: 7214935
    Abstract: A method for preparing a transmission electron microscopy (TEM) sample for electron holography includes forming a sacrificial material over an area of interest on the sample, and polishing the sample to a desired thickness, wherein the area of interest is protected from rounding during the polishing. The sacrificial material is removed from the sample following the polishing.
    Type: Grant
    Filed: September 30, 2004
    Date of Patent: May 8, 2007
    Assignee: International Business Machines Corporation
    Inventors: Thomas A. Bauer, Steven H. Boettcher, Anthony G. Domenicucci, John G. Gaudiello, Leon J. Kimball, Jeffrey S. McMurray, Yun-Yu Wang
  • Method for improving spatial resolution and accuracy in scanning probe microscopy
    Patent number: 6210982
    Abstract: A method and apparatus for generating a spatially improved and accurate dopant density profile of a doped material using scanning probe microscopy, wherein the new method utilizes an iterative process to approach a dopant density profile having a user definable accuracy by creating a new two-dimensional gradient model which accounts for gradients in doping concentrations within the doped material.
    Type: Grant
    Filed: July 16, 1998
    Date of Patent: April 3, 2001
    Assignee: University of Utah Research Foundation
    Inventors: Clayton C. Williams, Jeffrey S. McMurray