Abstract: A system and method for centrally logging and aggregating miscompares on chip during a memory test. The method includes performing, by a built-in self-test (BIST) unit of a memory device, a memory test on one or more memory banks of the memory device using a first algorithm. The method includes generating miscompare results responsive to performing the memory test on the one or more memory banks of the memory device. The method includes determining failure diagnostic information based on the miscompare results. The method includes generating an error packet comprising the failure diagnostic information and the miscompare results. The method includes placing the error packet in a queue of a plurality of error packets to generate a queued error packet.

Abstract: A system and method for centrally logging and aggregating miscompares on chip during a memory test. The method includes performing, by a built-in self-test (BIST) unit of a memory device, a memory test on one or more memory banks of the memory device using a first algorithm. The method includes generating miscompare results responsive to performing the memory test on the one or more memory banks of the memory device. The method includes determining failure diagnostic information based on the miscompare results. The method includes generating an error packet comprising the failure diagnostic information and the miscompare results. The method includes placing the error packet in a queue of a plurality of error packets to generate a queued error packet.

Abstract: A memory having a circuit including a built-in address counter with a test mode. The address counter may be used to generate the memory array addressing for the different array test patterns. The circuit may comprise a logic circuit and a counter circuit. The logic circuit may be configured to generate one or more control signals in response to one or more control inputs. The counter circuit may be configured to generate a first counter output and a second counter output in response to (i) the control outputs and (ii) one or more inputs. The counter may comprise a first portion configured to generate the first counter output and a second portion configured to generate the second counter output.

Abstract: A circuit configured to generate an output clock signal generally having (i) a first frequency when in a first mode and (ii) a second frequency when in a second mode, in response to a plurality of signals. A delay of the output clock signal may be identical when operating in either the first mode or the second mode.

Abstract: A memory having a circuit including a built-in address counter with a test mode. The address counter may be used to generate the memory array addressing for the different array test patterns. The circuit may comprise a logic circuit and a counter circuit. The logic circuit may be configured to generate one or more control signals in response to one or more control inputs. The counter circuit may be configured to generate a first counter output and a second counter output in response to (i) the control outputs and (ii) one or more inputs. The counter may comprise a first portion configured to generate the first counter output and a second portion configured to generate the second counter output.