Abstract: A failure analysis and detection method for a memory is configured to perform abnormal bit detection on a memory. The failure analysis and detection method includes: coordinates are marked on a detection area of the memory, and the coordinates are associated with layout design or a process of the detection area; a MOD function is used to perform classification according to regularity of the coordinates, and the MOD function is a function for getting remainder; and failure information corresponding to the classification is obtained from a failure bitmap (FBM) of the detection area, and the failure information includes a failure cause corresponding to the layout design or the process.

Abstract: A failure analysis and detection method for a memory is configured to perform abnormal bit detection on a memory. The failure analysis and detection method includes: coordinates are marked on a detection area of the memory, and the coordinates are associated with layout design or a process of the detection area; a MOD function is used to perform classification according to regularity of the coordinates, and the MOD function is a function for getting remainder; and failure information corresponding to the classification is obtained from a failure bitmap (FBM) of the detection area, and the failure information includes a failure cause corresponding to the layout design or the process.