Patents by Inventor Jen Yang Hsueh

Jen Yang Hsueh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230238058
    Abstract: When programming an MLC memory device, the disturb characteristics of a program block having multiple memory cells are measured, and the threshold voltage variations of the multiple memory cells are then acquired based on the disturb characteristics of the program block. Next, multiple initial program voltage pulses are provided according to a predetermined signal level, and multiple compensated program voltage pulses are provided by adjusting the multiple initial program voltage pulses. Last, the multiple compensated program voltage pulses are outputted to the program block for programming the multiple memory cells to the predetermined signal level.
    Type: Application
    Filed: February 24, 2022
    Publication date: July 27, 2023
    Applicant: UNITED MICROELECTRONICS CORP.
    Inventors: Chia-Wen Wang, Chien-Hung Chen, Chia-Hui Huang, Jen-Yang Hsueh, Ling-Hsiu Chou, Chih-Yang Hsu
  • Patent number: 11532716
    Abstract: A non-volatile memory device includes a substrate. A plurality of shallow trench isolation (STI) lines are disposed on the substrate and extend along a first direction. A memory gate structure is disposed on the substrate between adjacent two of the plurality of STI lines. A trench line is disposed in the substrate and extends along a second direction intersecting the first direction, wherein the trench line also crosses top portions of the plurality of STI lines. A conductive line is disposed in the trench line and used as a selection line to be coupled to the memory gate structure.
    Type: Grant
    Filed: February 18, 2020
    Date of Patent: December 20, 2022
    Assignee: UNITED MICROELECTRONICS CORP.
    Inventors: Chia-Wen Wang, Chien-Hung Chen, Chia-Hui Huang, Jen Yang Hsueh, Ling Hsiu Chou, Chih-Yang Hsu
  • Publication number: 20210217866
    Abstract: A non-volatile memory device includes a substrate. A plurality of shallow trench isolation (STI) lines are disposed on the substrate and extend along a first direction. A memory gate structure is disposed on the substrate between adjacent two of the plurality of STI lines. A trench line is disposed in the substrate and extends along a second direction intersecting the first direction, wherein the trench line also crosses top portions of the plurality of STI lines. A conductive line is disposed in the trench line and used as a selection line to be coupled to the memory gate structure.
    Type: Application
    Filed: February 18, 2020
    Publication date: July 15, 2021
    Applicant: United Microelectronics Corp.
    Inventors: Chia-Wen Wang, Chien-Hung Chen, Chia-Hui Huang, Jen Yang Hsueh, Ling Hsiu Chou, Chih-Yang Hsu