Patents by Inventor Jen-Yi Wuu

Jen-Yi Wuu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240037897
    Abstract: An apparatus and method of feature extraction for identifying a pattern. An improved method includes obtaining data representative of a pattern instance, dividing the pattern instance into a plurality of zones, determining a representative characteristic of a zone of the plurality of zones, generating a representation of the pattern instance using a feature vector, wherein the feature vector includes an element corresponding to the representative characteristic, wherein the representative characteristic is indicative of a spatial distribution of one or more features of the zone. The method may also include classifying and/or selecting pattern instances based on the feature vector.
    Type: Application
    Filed: November 24, 2021
    Publication date: February 1, 2024
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Danying LI, Meng LIU, Jen-Yi WUU, Rencheng SUN, Cong WU, Dean XU
  • Publication number: 20230273528
    Abstract: A method for selecting patterns for training a model to predict patterns to be printed on a substrate. The method includes (a) obtaining images of multiple patterns, wherein the multiple patterns correspond to target patterns to be printed on a substrate; (b) grouping the images into a group of special patterns and multiple groups of main patterns; and (c) outputting a set of patterns based on the images as training data for training the model, wherein the set of patterns includes the group of special patterns and a representative main pattern from each group of main patterns.
    Type: Application
    Filed: July 29, 2021
    Publication date: August 31, 2023
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Rencheng SUN, Qi JIA, Meng LIU, Weixuan HU, Jen-Yi WUU, Hao CHEN
  • Publication number: 20210357566
    Abstract: A method of generating a characteristic pattern for a patterning process and training a machine learning model. The method for generating the characteristic pattern includes obtaining a trained generator model configured to generate a characteristic pattern (e.g., a hot spot pattern), and an input pattern; and generating, via simulation using the trained generator model (e.g., CNN), the characteristic pattern based on the input pattern, wherein the input pattern can be a random vector and/or a class of pattern.
    Type: Application
    Filed: October 8, 2019
    Publication date: November 18, 2021
    Applicant: ASML NETHERLAND B.V.
    Inventors: Mark Christopher SIMMONS, Chenxi LIN, Jen-Yi WUU
  • Patent number: 8504949
    Abstract: Aspects of the invention relate to hybrid hotspot detection techniques. The hybrid hotspot detection techniques combine machine learning classification, pattern matching and process simulation. A machine learning model, along with false hotspots and false non-hotspots for pattern matching, is determined based on training patterns. The determined machine learning model is then used to classify patterns in a layout design into three categories: preliminary hotspots, preliminary non-hotspots and potential hotspots. Pattern matching is then employed to identify false positives and false negatives in the first two categories. Process simulation is employed to identify boundary hotspots in the last category.
    Type: Grant
    Filed: July 26, 2011
    Date of Patent: August 6, 2013
    Assignee: Mentor Graphics Corporation
    Inventors: Juan Andres Torres Robles, Salma Mostafa Fahmy, Peter Louiz Rezk Beshay, Kareem Madkour, Fedor G Pikus, Jen-Yi Wuu, Duo Ding
  • Patent number: 8402397
    Abstract: Aspects of the invention relate to machine-learning-based hotspot detection techniques. These hotspot detection techniques employ machine learning models constructed using two feature encoding schemes. When two-level machine learning methods are also employed, a total four machine learning models are constructed: scheme-one level-one, scheme-one level-two, scheme-two level-one and scheme-two level-two. The four models are applied to test patterns to derive scheme-one hotspot information and scheme-two hotspot information, which are then used to determine final hotspot information.
    Type: Grant
    Filed: July 26, 2011
    Date of Patent: March 19, 2013
    Assignee: Mentor Graphics Corporation
    Inventors: Juan Andres Torres Robles, Salma Mostafa Fahmy, Kareem Madkour, Jen-Yi Wuu
  • Publication number: 20130031522
    Abstract: Aspects of the invention relate to machine-learning-based hotspot detection techniques. These hotspot detection techniques employ machine learning models constructed using two feature encoding schemes. When two-level machine learning methods are also employed, a total four machine learning models are constructed: scheme-one level-one, scheme-one level-two, scheme-two level-one and scheme-two level-two. The four models are applied to test patterns to derive scheme-one hotspot information and scheme-two hotspot information, which are then used to determine final hotspot information.
    Type: Application
    Filed: July 26, 2011
    Publication date: January 31, 2013
    Inventors: Juan Andres Torres Robles, Salma Mostafa Fahmy, Kareem Madkour, Jen-Yi Wuu
  • Publication number: 20130031518
    Abstract: Aspects of the invention relate to hybrid hotspot detection techniques. The hybrid hotspot detection techniques combine machine learning classification, pattern matching and process simulation. A machine learning model, along with false hotspots and false non-hotspots for pattern matching, is determined based on training patterns. The determined machine learning model is then used to classify patterns in a layout design into three categories: preliminary hotspots, preliminary non-hotspots and potential hotspots. Pattern matching is then employed to identify false positives and false negatives in the first two categories. Process simulation is employed to identify boundary hotspots in the last category.
    Type: Application
    Filed: July 26, 2011
    Publication date: January 31, 2013
    Inventors: Juan Andres Torres Robles, Salma Mostafa Fahmy, Peter Louiz Rezk Beshay, Kareem Madkour, Fedor G. Pikus, Jen-Yi Wuu, Duo Ding