Abstract: Disclosed are a cost-effective light source device that can eliminate highlights or hotspots and reduce halo phenomenon on resistor surface and a method for reading resistor value with computer vision, in which an image of a body of a resistor is extracted through irradiation by an annular light source and reflection by a replaceable diffuse reflection hood such as paper box, paper bowl, or paper cup inside pasted with white paper and extraction by an image extraction device, followed by a series of image processing operations conducted by a control unit to calculate a disposition angle of the resistor in an image. Luminous elements on opposite axial ends of the resistor are activated, according to the disposition angle, for illumination, while luminous elements on opposite lateral sides of the resistor are shut down so that a clear color resistor image can be obtained.

Abstract: Disclosed are a cost-effective light source device that can eliminate highlights or hotspots and reduce halo phenomenon on resistor surface and a method for reading resistor value with computer vision, in which an image of a body of a resistor is extracted through irradiation by an annular light source and reflection by a replaceable diffuse reflection hood such as paper box, paper bowl, or paper cup inside pasted with white paper and extraction by an image extraction device, followed by a series of image processing operations conducted by a control unit to calculate a disposition angle of the resistor in an image. Luminous elements on opposite axial ends of the resistor are activated, according to the disposition angle, for illumination, while luminous elements on opposite lateral sides of the resistor are shut down so that a clear color resistor image can be obtained.

Abstract: A high thermal change rate of test apparatus aims to realize test equipment requirement of highly accelerated life test(HALT) and highly accelerated stress screening(HASS). Structurally, the apparatus is provided with a cabinet body with an interior for placing test specimen. The cabinet body is provided with elements of fans, electric heating tubes and liquid nitrogen nozzles therein. The positions of the cabinet body and the control system are separate. Several groups (normally 2 or 3 groups, depends on the size of cabinet) of liquid nitrogen pipes connecting the cabinet body are flexible stainless steel pipes for enclosing and insulating sleeve tubes. During full-speed temperature cooling, all groups of the pipes simultaneously eject liquid nitrogen. When temperature is constant, only one group of liquid nitrogen pipe with cryogenic valve and nozzles is used and micro-adjusted to achieve good temperature stability.

Abstract: A high thermal change rate of test apparatus aims to realize test equipment requirement of highly accelerated life test(HALT) and highly accelerated stress screening(HASS). Structurally, the apparatus is provided with a cabinet body with an interior for placing test specimen. The cabinet body is provided with elements of fans, electric heating tubes and liquid nitrogen nozzles therein. The positions of the cabinet body and the control system are separate. Several groups (normally 2 or 3 groups, depends on the size of cabinet) of liquid nitrogen pipes connecting the cabinet body are flexible stainless steel pipes for enclosing and insulating sleeve tubes. During full-speed temperature cooling, all groups of the pipes simultaneously eject liquid nitrogen. When temperature is constant, only one group of liquid nitrogen pipe with cryogenic valve and nozzles is used and micro-adjusted to achieve good temperature stability.