Patents by Inventor Jennifer F. Shumacher

Jennifer F. Shumacher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Batch authentication of materials for automated anti counterfeiting
    Patent number: 10551524
    Abstract: Systems and methods for authenticating material samples are provided. Characteristic features are measured for a batch of material samples that comprise substantially the same composition and are produced by substantially the same process. The measured characteristic features have respective variability that is analyzed to extract statistical parameters. In some cases, reference ranges are determined based on the extracted statistical parameters for the batch of material samples. The corresponding statistical parameters of a test material sample are compared to the reference ranges to verify whether the test material sample is authentic.
    Type: Grant
    Filed: December 7, 2015
    Date of Patent: February 4, 2020
    Assignee: 3M INNOVATIVE PROPERTY COMPANIES
    Inventors: Anthony J. Sabelli, Jennifer F. Shumacher, Yanina Shkel, Brian J. Stankiewicz, Glenn E. Casner, John A. Wheatley, Andrew P. Bonifas, Ravishankar Sivalingam
  • BATCH AUTHENTICATION OF MATERIALS FOR AUTOMATED ANTI COUNTERFEITING
    Publication number: 20170363772
    Abstract: Systems and methods for authenticating material samples are provided. Characteristic features are measured for a batch of material samples that comprise substantially the same composition and are produced by substantially the same process. The measured characteristic features have respective variability that is analyzed to extract statistical parameters. In some cases, reference ranges are determined based on the extracted statistical parameters for the batch of material samples. The corresponding statistical parameters of a test material sample are compared to the reference ranges to verify whether the test material sample is authentic.
    Type: Application
    Filed: December 7, 2015
    Publication date: December 21, 2017
    Inventors: Anthony J. Sabelli, Jennifer F. Shumacher, Yanina Shkel, Brian J. Stankiewicz, Glenn E. Casner, John A. Wheatley, Andrew P. Bonifas, Ravishankar Sivalingam