Patents by Inventor Jennifer Meng-Tzu Cheng

Jennifer Meng-Tzu Cheng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for characterizing a semiconductor device
    Patent number: 6319737
    Abstract: A method and apparatus are provided for providing characterization data for semiconductor devices. A first data set containing measured results obtained from wafer electrical tests performed on the semiconductor device during the fabrication process is compared to a second data set containing values corresponding to design characteristics for the semiconductor device. Based on this comparison, semiconductor devices having valid and invalid performance characteristics are identified. The characterization results data are subsequently generated for the identified semiconductor devices.
    Type: Grant
    Filed: August 10, 1999
    Date of Patent: November 20, 2001
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Gary Gene Putnam, Jennifer Meng-Tzu Cheng, Chin-Yang Sun