Patents by Inventor Jens Haenisch

Jens Haenisch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for measuring critical current properties of a coated conductor
    Patent number: 8228055
    Abstract: The transverse critical-current uniformity in a superconducting tape was determined using a magnetic knife apparatus. A critical current Ic distribution and transverse critical current density Jc distribution in YBCO coated conductors was measured nondestructively with high resolution using a magnetic knife apparatus. The method utilizes the strong depression of Jc in applied magnetic fields. A narrow region of low, including zero, magnetic field in a surrounding higher field is moved transversely across a sample of coated conductor. This reveals the critical current density distribution. A Fourier series inversion process was used to determine the transverse Jc distribution in the sample.
    Type: Grant
    Filed: September 15, 2009
    Date of Patent: July 24, 2012
    Assignee: Los Alamos National Security, LLC
    Inventors: Fred M. Mueller, Jens Haenisch
  • APPARATUS AND METHOD FOR MEASURING CRITICAL CURRENT PROPERTIES OF A COATED CONDUCTOR
    Publication number: 20100066357
    Abstract: The transverse critical-current uniformity in a superconducting tape was determined using a magnetic knife apparatus. A critical current Ic distribution and transverse critical current density Jc distribution in YBCO coated conductors was measured nondestructively with high resolution using a magnetic knife apparatus. The method utilizes the strong depression of Jc in applied magnetic fields. A narrow region of low, including zero, magnetic field in a surrounding higher field is moved transversely across a sample of coated conductor. This reveals the critical current density distribution. A Fourier series inversion process was used to determine the transverse Jc distribution in the sample.
    Type: Application
    Filed: September 15, 2009
    Publication date: March 18, 2010
    Applicant: LOS ALAMOS NATIONAL SECURITY, LLC
    Inventors: Fred M. Mueller, Jens Haenisch