Patents by Inventor Jens Hoehndorf

Jens Hoehndorf has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230145540
    Abstract: The invention relates to devices and methods for desorption scanning of analyte material deposited on a sample support, which can comprise the following mode of operation: (a) setting a position of the support to approach an impingement region onto which a beam is directed for local desorption of analyte material; (b) determining an actual position of the support after setting the position; (c) comparing the determined actual position with a target position of the support to determine any deviation; (d) adjusting a beam orientation, if a deviation is detected, so that the beam is directed onto the impingement region on the support that results when there is no deviation; (e) applying the beam to the impingement region to locally desorb analyte material and deliver it to an analyzer; and (f) checking whether a predetermined end condition is satisfied and, if not, repeating steps (a)-(e) for a subsequent non-congruent impingement region.
    Type: Application
    Filed: November 1, 2022
    Publication date: May 11, 2023
    Inventors: Andreas HAASE, Marcel NIEHAUS, Jens HÖHNDORF
  • Patent number: 11581174
    Abstract: The disclosure relates to a method of operating a secondary-electron multiplier in the ion detector of a mass spectrometer so as to prolong the service life, wherein the secondary-electron multiplier is supplied with an operating voltage in such a way that an amplification of less than 106 secondary electrons per impinging ion results, while the output current of the secondary-electron multiplier is amplified using an electronic preamplifier mounted close to the secondary-electron multiplier with such a low noise level that the current pulses of individual ions impinging on the ion detector are detected above the noise at the input of a digitizing unit. Further disclosed are the use of the methods for imaging mass spectrometric analysis of a thin tissue section or mass spectrometric high-throughput analysis/massive-parallel analysis, and a time-of-flight mass spectrometer whose control unit is programmed to execute such methods.
    Type: Grant
    Filed: May 31, 2021
    Date of Patent: February 14, 2023
    Inventors: Sebastian Böhm, Andreas Haase, Jens Höhndorf
  • Publication number: 20220285142
    Abstract: An apparatus to generate ions from sample material deposited on a substrate which is at least partially transparent to electromagnetic waves, comprises: —a support device having a holder for the substrate, —a desorption/ionization unit including a desorption device and an ionization device, said desorption device being configured to desorb deposited sample material from a desorption site on the substrate using at least one energy burst, and said ionization device being configured to irradiate the desorbed sample material above the substrate with electromagnetic waves after the at least one energy burst, wherein the electromagnetic waves pass through the substrate before encountering the desorbed sample material at a location which corresponds to the desorption site, and —an extraction device which is arranged and designed to extract ions from the desorbed sample material and transfer them into an analyzer. The invention also relates to a correspondingly arranged method.
    Type: Application
    Filed: March 1, 2022
    Publication date: September 8, 2022
    Inventors: Andreas HAASE, Jens HÖHNDORF, Jens BOßMEYER
  • Publication number: 20210287891
    Abstract: The disclosure relates to a method of operating a secondary-electron multiplier in the ion detector of a mass spectrometer so as to prolong the service life, wherein the secondary-electron multiplier is supplied with an operating voltage in such a way that an amplification of less than 106 secondary electrons per impinging ion results, while the output current of the secondary-electron multiplier is amplified using an electronic preamplifier mounted close to the secondary-electron multiplier with such a low noise level that the current pulses of individual ions impinging on the ion detector are detected above the noise at the input of a digitizing unit. Further disclosed are the use of the methods for imaging mass spectrometric analysis of a thin tissue section or mass spectrometric high-throughput analysis/massive-parallel analysis, and a time-of-flight mass spectrometer whose control unit is programmed to execute such methods.
    Type: Application
    Filed: May 31, 2021
    Publication date: September 16, 2021
    Inventors: Sebastian BÖHM, Andreas HAASE, Jens HÖHNDORF
  • Patent number: 11081328
    Abstract: The invention relates to imaging mass spectrometry on thin sample sections, in particular using MALDI, where a high lateral image resolution means that a plethora of mass spectra has to be acquired and the image acquisition runs over many hours. The quality of the mass spectra deteriorates considerably over time in such cases. The invention is based on the finding that the decrease in spectral quality of continuous measurement series over many hours is only partially caused by a decrease in detector gain, and that another significant cause is a decrease in the number of usable ions per ion generating pulse, which is attributable to several phenomena that are difficult to regulate. The invention now proposes to instead regulate only the detector gain, and such that not only the decrease in the detector gain is compensated, but also the decrease in the number of usable ions per ion generating pulse.
    Type: Grant
    Filed: February 5, 2020
    Date of Patent: August 3, 2021
    Inventors: Jens Höhndorf, Andreas Haase
  • Patent number: 11049705
    Abstract: The disclosure relates to a method of operating a secondary-electron multiplier in the ion detector of a mass spectrometer so as to prolong the service life, wherein the secondary-electron multiplier is supplied with an operating voltage in such a way that an amplification of less than 106 secondary electrons per impinging ion results, while the output current of the secondary-electron multiplier is amplified using an electronic preamplifier mounted close to the secondary-electron multiplier with such a low noise level that the current pulses of individual ions impinging on the ion detector are detected above the noise at the input of a digitizing unit. Further disclosed are the use of the methods for imaging mass spectrometric analysis of a thin tissue section or mass spectrometric high-throughput analysis/massive-parallel analysis, and a time-of-flight mass spectrometer whose control unit is programmed to execute such methods.
    Type: Grant
    Filed: March 20, 2019
    Date of Patent: June 29, 2021
    Inventors: Sebastian Böhm, Andreas Haase, Jens Höhndorf
  • Publication number: 20200258728
    Abstract: The invention relates to imaging mass spectrometry on thin sample sections, in particular using MALDI, where a high lateral image resolution means that a plethora of mass spectra has to be acquired and the image acquisition runs over many hours. The quality of the mass spectra deteriorates considerably over time in such cases. The invention is based on the finding that the decrease in spectral quality of continuous measurement series over many hours is only partially caused by a decrease in detector gain, and that another significant cause is a decrease in the number of usable ions per ion generating pulse, which is attributable to several phenomena that are difficult to regulate. The invention now proposes to instead regulate only the detector gain, and such that not only the decrease in the detector gain is compensated, but also the decrease in the number of usable ions per ion generating pulse.
    Type: Application
    Filed: February 5, 2020
    Publication date: August 13, 2020
    Inventors: Jens HÖHNDORF, Andreas HAASE
  • Publication number: 20190304764
    Abstract: The disclosure relates to a method of operating a secondary-electron multiplier in the ion detector of a mass spectrometer so as to prolong the service life, wherein the secondary-electron multiplier is supplied with an operating voltage in such a way that an amplification of less than 106 secondary electrons per impinging ion results, while the output current of the secondary-electron multiplier is amplified using an electronic preamplifier mounted close to the secondary-electron multiplier with such a low noise level that the current pulses of individual ions impinging on the ion detector are detected above the noise at the input of a digitizing unit. Further disclosed are the use of the methods for imaging mass spectrometric analysis of a thin tissue section or mass spectrometric high-throughput analysis/massive-parallel analysis, and a time-of-flight mass spectrometer whose control unit is programmed to execute such methods.
    Type: Application
    Filed: March 20, 2019
    Publication date: October 3, 2019
    Inventors: Sebastian BÖHM, Andreas HAASE, Jens HÖHNDORF
  • Patent number: 10186408
    Abstract: The invention relates to a low-cost spring steel plate as the sample support on a dimensionally stable and precisely shaped substructure, machined from an aluminum alloy, for example, and using a pattern of embedded magnets so that said plate is removable and that a body is created overall which is suitable for use in robots, for example by giving it the dimensions of a conventional microtitration plate. The planarity of the surface onto which the (organic) samples are applied is provided within the near region by the spring steel plate itself and in the far region over the whole spring steel plate by the substructure. The spring steel plate may be designed for single use in order to satisfy IVD diagnostic regulations also, for example. It can be equipped with identification codes, sample site markings and pre-coatings for different types of analytical tasks, such as MALDI-TOF mass spectrometric analysis.
    Type: Grant
    Filed: January 17, 2017
    Date of Patent: January 22, 2019
    Inventor: Jens Hoehndorf
  • Publication number: 20170125227
    Abstract: The invention relates to a low-cost spring steel plate as the sample support on a dimensionally stable and precisely shaped substructure, machined from an aluminum alloy, for example, and using a pattern of embedded magnets so that said plate is removable and that a body is created overall which is suitable for use in robots, for example by giving it the dimensions of a conventional microtitration plate. The planarity of the surface onto which the (organic) samples are applied is provided within the near region by the spring steel plate itself and in the far region over the whole spring steel plate by the substructure. The spring steel plate may be designed for single use in order to satisfy IVD diagnostic regulations also, for example. It can be equipped with identification codes, sample site markings and pre-coatings for different types of analytical tasks, such as MALDI-TOF mass spectrometric analysis.
    Type: Application
    Filed: January 17, 2017
    Publication date: May 4, 2017
    Inventor: Jens HOEHNDORF
  • Patent number: 9564303
    Abstract: The invention relates to a low-cost spring steel plate as the sample support on a dimensionally stable and precisely shaped substructure, machined from an aluminum alloy, for example, and using a pattern of embedded magnets so that said plate is removable and that a body is created overall which is suitable for use in robots, for example by giving it the dimensions of a conventional microtitration plate. The planarity of the surface onto which the (organic) samples are applied is provided within the near region by the spring steel plate itself and in the far region over the whole spring steel plate by the substructure. The spring steel plate may be designed for single use in order to satisfy IVD diagnostic regulations also, for example. It can be equipped with identification codes, sample site markings and pre-coatings for different types of analytical tasks, such as MALDI-TOF mass spectrometric analysis.
    Type: Grant
    Filed: September 22, 2015
    Date of Patent: February 7, 2017
    Inventor: Jens Hoehndorf
  • Publication number: 20160099138
    Abstract: The invention relates to a low-cost spring steel plate as the sample support on a dimensionally stable and precisely shaped substructure, machined from an aluminum alloy, for example, and using a pattern of embedded magnets so that said plate is removable and that a body is created overall which is suitable for use in robots, for example by giving it the dimensions of a conventional microtitration plate. The planarity of the surface onto which the (organic) samples are applied is provided within the near region by the spring steel plate itself and in the far region over the whole spring steel plate by the substructure. The spring steel plate may be designed for single use in order to satisfy IVD diagnostic regulations also, for example. It can be equipped with identification codes, sample site markings and pre-coatings for different types of analytical tasks, such as MALDI-TOF mass spectrometric analysis.
    Type: Application
    Filed: September 22, 2015
    Publication date: April 7, 2016
    Inventor: Jens HOEHNDORF
  • Patent number: 8872103
    Abstract: Mass spectrometers ionize samples by matrix-assisted laser desorption (MALDI). The samples are located on a moveable support plate, and irradiated by a pulsed laser. A fast positional control of laser spots is provided via a system of rotatable mirrors to relieve strain on a support plate motion drive. If the spot position is finely adjusted by the mirror system and follows the movement of the sample support plate, the intermittent movement of the sample support can be replaced with a continuous uniform motion. The fast positional control allows more uniform ablation of a sample area. Galvo mirrors with low inertia may be used between the beam generation and a Kepler telescope in the housing of the laser. The positional control can also provide a fully automatic adjustment of MALDI time-of-flight mass spectrometers, at least if the ion-optical elements are equipped with movement devices.
    Type: Grant
    Filed: September 6, 2012
    Date of Patent: October 28, 2014
    Assignee: Bruker Daltonik GmbH
    Inventors: Armin Holle, Andreas Haase, Jens Hoehndorf
  • Patent number: 8497472
    Abstract: The invention relates to a method by which the operator of a mass spectrometer with a MALDI ion source, particularly one which operates with delayed extraction of the ions, is provided with a technique for determining the degree of contamination, in particular to determine when the ion source must be cleaned. The method comprises the acquisition of at least one mass spectrum of ions which are generated in the ion source, the recording of at least one characteristic value for each of at least two mass signals in the mass spectrum, and the determination of an indicator number, derived from the characteristic values of at least two mass signals, which shows how urgently the ion source must be cleaned. The invention also relates to a mass spectrometer with a MALDI ion source which can be characterized accordingly.
    Type: Grant
    Filed: March 12, 2012
    Date of Patent: July 30, 2013
    Assignee: Bruker Daltonik GmbH
    Inventors: Jens Höhndorf, Sebastian Böhm
  • Patent number: 8431890
    Abstract: The invention relates to a mass spectrometer comprising a laser system for mass-spectrometric analysis with ionization of analyte molecules in a sample by matrix-assisted laser desorption. A mass spectrometer with a pulsed UV laser system produces a spatially distributed spot pattern with peaks of uniform energy density on the sample, increasing thereby the degree of ionization for analyte ions as compared to conventional spot patterns. The spot pattern with peaks of uniform energy density can be produced by homogeneous illumination of a pattern generator, for example a lens array. The homogeneous illumination can be generated by a low-cost beam-shaping element, which does not act on the UV beam but on the original infrared beam, in conjunction with changes to the beam cross-section and beam profile brought about by the nonlinear conversion crystals.
    Type: Grant
    Filed: October 19, 2012
    Date of Patent: April 30, 2013
    Assignee: Bruker Daltonik GmbH
    Inventors: Andreas Haase, Jens Hoehndorf
  • Publication number: 20130056628
    Abstract: Mass spectrometers ionize samples by matrix-assisted laser desorption (MALDI). The samples are located on a moveable support plate, and irradiated by a pulsed laser. A fast positional control of laser spots is provided via a system of rotatable mirrors to relieve strain on a support plate motion drive. If the spot position is finely adjusted by the mirror system and follows the movement of the sample support plate, the intermittent movement of the sample support can be replaced with a continuous uniform motion. The fast positional control allows more uniform ablation of a sample area. Galvo mirrors with low inertia may be used between the beam generation and a Kepler telescope in the housing of the laser. The positional control can also provide a fully automatic adjustment of MALDI time-of-flight mass spectrometers, at least if the ion-optical elements are equipped with movement devices.
    Type: Application
    Filed: September 6, 2012
    Publication date: March 7, 2013
    Inventors: Armin Holle, Andreas Haase, Jens Hoehndorf
  • Publication number: 20120228489
    Abstract: The invention relates to a method by which the operator of a mass spectrometer with a MALDI ion source, particularly one which operates with delayed extraction of the ions, is provided with a technique for determining the degree of contamination, in particular to determine when the ion source must be cleaned. The method comprises the acquisition of at least one mass spectrum of ions which are generated in the ion source, the recording of at least one characteristic value for each of at least two mass signals in the mass spectrum, and the determination of an indicator number, derived from the characteristic values of at least two mass signals, which shows how urgently the ion source must be cleaned. The invention also relates to a mass spectrometer with a MALDI ion source which can be characterized accordingly.
    Type: Application
    Filed: March 12, 2012
    Publication date: September 13, 2012
    Inventors: Jens Höhndorf, Sebastian Böhm
  • Patent number: 8110795
    Abstract: Mass spectrometry with lasers generates ions from analyte molecules by matrix assisted laser desorption for a variety of different mass spectrometric analysis procedures. The mass spectrometers with laser systems supply laser light pulses having at least two different pulse durations, and mass spectrometric measuring techniques use the laser light pulses of different durations. The duration of the laser light pulses allows the characteristics of the ionization of the analyte molecules, particularly the occurrence of the ISD (in-source decay) and PSD (post-source decay) types of fragmentation, whose fragment ion spectra supply different kinds of information, to be adapted to the analytic procedure.
    Type: Grant
    Filed: March 3, 2010
    Date of Patent: February 7, 2012
    Assignee: Brucker Daltonik GmbH
    Inventors: Andreas Haase, Jens Höhndorf, Jochen Franzen
  • Publication number: 20110139977
    Abstract: Analyte ions are generated in an ion source by matrix-assisted laser desorption (MALDI) in which laser light pulses have significantly less than one nanosecond duration, focal diameters of less than twenty micrometers and energy densities such that only about one picogram of sample is desorbed per pulse of laser light and per laser spot. An unexpectedly high degree of ionization of analyte molecules is produced for selected matrix substances. Many laser spots can be generated side-by-side from a single laser light pulse for use with MALDI time-of-flight mass spectrometers. Applying pulses with a repetition rate of around 50 kilohertz and moving the sample or guiding the laser light beam so each laser light pulse impinges on a cool sample spot allows the ion source to be used with spectrometers that require a constant ion current.
    Type: Application
    Filed: February 17, 2011
    Publication date: June 16, 2011
    Applicant: BRUKER DALTONIK GMBH
    Inventors: Andreas Haase, Jens Höhndorf
  • Patent number: 7872226
    Abstract: In a time-of-flight mass spectrometer having an ion source with a first accelerating electrode, a distance between the surface of a sample and the first accelerating electrode is maintained at a predetermined distance which is critical for determining the mass and quantity of ions generated by the ion source. A digital image of the sample surface is obtained with a digital camera and a predetermined characteristic of the digital image is determined. The predetermined characteristic is then used to compute an adjustment amount by which the sample surface is moved to maintain the predetermined distance. Determining the predetermined characteristic can be simplified by projecting a light pattern onto the sample surface at an angle and determining the predetermined characteristic from the digital image of the pattern.
    Type: Grant
    Filed: January 7, 2008
    Date of Patent: January 18, 2011
    Assignee: Bruker Daltonik GmbH
    Inventors: Jens Höhndorf, Andreas Haase