Patents by Inventor Jens Rafaelsen

Jens Rafaelsen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Devices and systems for spatial aggregation of spectral analysis from electron microscopes
    Patent number: 10139356
    Abstract: An x-ray spectrum collected from a sample via excitation of the sample by an electron beam includes artifacts due to interaction volume, surface effects, contamination, or other interferences with the desired collection of representative x-rays from the sample. Inline spectral correlation, summation, averaging, other aggregation, or combinations thereof provides more precise collection of x-ray spectrum from multi-phase, unprepared, particle, or complex samples.
    Type: Grant
    Filed: September 15, 2017
    Date of Patent: November 27, 2018
    Assignee: EDAX, Incorporated
    Inventors: Divyesh I. Patel, Tara Lyn Nylese, Jens Rafaelsen, Stuart Ian Wright
  • DEVICES AND SYSTEMS FOR SPATIAL AGGREGATION OF SPECTRAL ANALYSIS FROM ELECTRON MICROSCOPES
    Publication number: 20180003651
    Abstract: An x-ray spectrum collected from a sample via excitation of the sample by an electron beam includes artifacts due to interaction volume, surface effects, contamination, or other interferences with the desired collection of representative x-rays from the sample. Inline spectral correlation, summation, averaging, other aggregation, or combinations thereof provides more precise collection of x-ray spectrum from multi-phase, unprepared, particle, or complex samples.
    Type: Application
    Filed: September 15, 2017
    Publication date: January 4, 2018
    Inventors: Divyesh I. Patel, Tara Lyn Nylese, Jens Rafaelsen, Stuart Ian Wright