Abstract: Disclosed are a method and an apparatus for an instant messaging service to provide a schedule service. A schedule management server according to an example embodiment includes receiving a schedule creating request, selecting any one of a first type of calendar belonging to a chatroom in which the schedule creating request is created and a second type of calendar belonging to a user account which creates the schedule creating request, according to a schedule type included in the schedule creating request; and creating a schedule corresponding to the selected type of calendar.

Abstract: Provided is a hypertube transport system. Specifically, provided are a magnetically-levitated train and an infrastructure-system in which same travels, comprising: refrigerant for cooling compressed air of a hypertube train, and a compressed air cooling system utilizing the refrigerant; an apparatus and method for controlling trains operating in a vacuum tube; superconducting switches for superconducting magnets for magnetic levitation; a driving stability apparatus for the hypertube transport system; a control apparatus for trains of the hypertube transport system; and an energy harvester.

Abstract: A tube infrastructure includes a first tube; a second tube that is coupled to the first tube; and a fluid tank that is disposed to surround a coupling region of the first tube and the second tube and is filled with a fluid to seal the coupling region, wherein the fluid tank allows negative pressure to be maintained inside the first tube and the second tube.

Abstract: A tube infrastructure includes a first tube; a second tube that is coupled to the first tube; and a fluid tank that is disposed to surround a coupling region of the first tube and the second tube and is filled with a fluid to seal the coupling region, wherein the fluid tank allows negative pressure to be maintained inside the first tube and the second tube.

Abstract: The present disclosure provides a hypertube system for detecting a position of a hypertube vehicle, including a hypertube vehicle, a tube configured to surround a travel path of the hypertube vehicle, At least one LiDAR sensor each mounted on an inner wall of the tube and including a laser transmitter configured to irradiate a laser beam toward the hypertube vehicle and a laser receiver configured to detect a laser, and a reflector configured to reflect the laser irradiated from the LiDAR sensor, wherein the reflector may be disposed in the hypertube vehicle, and wherein the laser beam reflected from the reflector reaches the laser receiver of the LiDAR sensor to be used in detecting the position of the hypertube vehicle.

Abstract: Provided is a hypertube transport system. Specifically, provided are a magnetically-levitated train and an infrastructure-system in which same travels, comprising: refrigerant for cooling compressed air of a hypertube train, and a compressed air cooling system utilizing the refrigerant; an apparatus and method for controlling trains operating in a vacuum tube; superconducting switches for superconducting magnets for magnetic levitation; a driving stability apparatus for the hypertube transport system; a control apparatus for trains of the hypertube transport system; and an energy harvester.

Abstract: A method for predicting a failure rate of a semiconductor integrated circuit includes receiving a circuit netlist corresponding to circuit defining data, which defines a connection relation, input, output, size, type and operating temperature of each transistor of a plurality of transistors included in the semiconductor integrated circuit. Low-risk transistors having a low-failure probability among the plurality of transistors are detected and filtered out based on the circuit netlist. Failure rates are calculated of respective high-risk transistors other than the low-risk transistors among the plurality of transistors. A total failure rate of the semiconductor integrated circuit is calculated based on the failure rates of the respective high-risk transistors.

Abstract: Disclosed herein are a test instrument and a method of controlling the same, capable of performing a basic test on a sample of a patient, determining whether to perform an additional test, and displaying interfaces associated with a progress level, a necessary time, etc. of the additional test on a display unit when the additional test is performed, thereby enabling a user to visibly recognize information associated with a performing process of each test.

Abstract: A test apparatus and a method for controlling the same are provided. The test apparatus may receive information about a reaction device, information about a storage environment, and external environment information from a storage storing a sample and a sensor sensing the external environment of the test apparatus. The test apparatus may perform a variety of control actions for testing the sample based on a temperature of and around the reaction device, resulting in increased reliability of the test result.

Abstract: Disclosed are an analysis device and a method of determining a mounted state of a cartridge mounted in the analysis device. The analysis device includes: a mounting unit configured to mount a cartridge on which at least one well for containing a specimen is formed; a measuring unit configured to measure at least one signal corresponding to the at least one well formed on the cartridge; and an operation processor configured to process the at least one measured signal with respect to the at least one well measured by the measuring unit, wherein the operation processor determines a mounted state of the cartridge based on the at least one measured signal with respect to the at least one well formed on the cartridge.

Abstract: A method for predicting a failure rate of a semiconductor integrated circuit includes receiving a circuit netlist corresponding to circuit defining data, which defines a connection relation, input, output, size, type and operating temperature of each of a plurality of transistors included in the semiconductor integrated circuit. Low-risk transistors having a low-failure probability among the plurality of transistors are detected and filtered out based on the circuit netlist. Failure rates are calculated of respective high-risk transistors other than the low-risk transistors among the plurality of transistors. A total failure rate of the semiconductor integrated circuit is calculated based on the failure rates of the respective high-risk transistors.

Abstract: A test apparatus and a method for controlling the same are provided. The test apparatus may receive information about a reaction device, information about a storage environment, and external environment information from a storage storing a sample and a sensor sensing the external environment of the test apparatus. The test apparatus may perform a variety of control actions for testing the sample based on a temperature of and around the reaction device, resulting in increased reliability of the test result.

Abstract: Disclosed is a high frequency transformer for reducing leakage flux, including a voltage transformation unit for transforming a first voltage, which is inputted thereto, into a second voltage, wherein: a primary winding is divided; and a secondary winding is arranged between the divided primary windings.

Abstract: Disclosed are an analysis device and a method of determining a mounted state of a cartridge mounted in the analysis device. The analysis device includes: a mounting unit configured to mount a cartridge on which at least one well for containing a specimen is formed; a measuring unit configured to measure at least one signal corresponding to the at least one well formed on the cartridge; and an operation processor configured to process the at least one measured signal with respect to the at least one well measured by the measuring unit, wherein the operation processor determines a mounted state of the cartridge based on the at least one measured signal with respect to the at least one well formed on the cartridge.

Abstract: An inspection apparatus including a detector configured to emit light to a chamber in which reaction of a sample and a reagent occurs and to detect an optical signal from the chamber, and a controller configured to acquire optical property data based on the detected optical signal and to predict inspection results using the optical property data acquired until a reference point in time.