Patents by Inventor Jeong Min JO

Jeong Min JO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11787448
    Abstract: Provided is a hypertube transport system. Specifically, provided are a magnetically-levitated train and an infrastructure-system in which same travels, comprising: refrigerant for cooling compressed air of a hypertube train, and a compressed air cooling system utilizing the refrigerant; an apparatus and method for controlling trains operating in a vacuum tube; superconducting switches for superconducting magnets for magnetic levitation; a driving stability apparatus for the hypertube transport system; a control apparatus for trains of the hypertube transport system; and an energy harvester.
    Type: Grant
    Filed: August 28, 2018
    Date of Patent: October 17, 2023
    Assignee: KRRI
    Inventors: Kwan Sup Lee, Young Jun Jang, Jae Hoon Kim, Chang Young Lee, Lee Hyeon Kim, Min Hwan Ok, Jeong Min Jo, Jin Ho Lee, Jung Youl Lim, Jae Heon Choe, Su Yong Choi
  • Patent number: 11320070
    Abstract: A tube infrastructure includes a first tube; a second tube that is coupled to the first tube; and a fluid tank that is disposed to surround a coupling region of the first tube and the second tube and is filled with a fluid to seal the coupling region, wherein the fluid tank allows negative pressure to be maintained inside the first tube and the second tube.
    Type: Grant
    Filed: July 19, 2018
    Date of Patent: May 3, 2022
    Assignee: KOREA RAILROAD RESEARCH INSTITUTE
    Inventors: Jae Heon Choe, Kwan Sup Lee, Su Yong Choi, Chang Young Lee, Jung Youl Lim, Jin Ho Lee, Yong Jun Jang, Jeong Min Jo, Min Hwan Ok, Jae Hoon Kim
  • Publication number: 20200362995
    Abstract: A tube infrastructure includes a first tube; a second tube that is coupled to the first tube; and a fluid tank that is disposed to surround a coupling region of the first tube and the second tube and is filled with a fluid to seal the coupling region, wherein the fluid tank allows negative pressure to be maintained inside the first tube and the second tube.
    Type: Application
    Filed: July 19, 2018
    Publication date: November 19, 2020
    Inventors: Jae Heon CHOE, Kwan Sup LEE, Su Yong CHOI, Chang Young LEE, Jung Youl LIM, Jin Ho LEE, Yong Jun JANG, Jeong Min JO, Min Hwan OK, Jae Hoon KIM
  • Publication number: 20200241137
    Abstract: The present disclosure provides a hypertube system for detecting a position of a hypertube vehicle, including a hypertube vehicle, a tube configured to surround a travel path of the hypertube vehicle, At least one LiDAR sensor each mounted on an inner wall of the tube and including a laser transmitter configured to irradiate a laser beam toward the hypertube vehicle and a laser receiver configured to detect a laser, and a reflector configured to reflect the laser irradiated from the LiDAR sensor, wherein the reflector may be disposed in the hypertube vehicle, and wherein the laser beam reflected from the reflector reaches the laser receiver of the LiDAR sensor to be used in detecting the position of the hypertube vehicle.
    Type: Application
    Filed: December 10, 2018
    Publication date: July 30, 2020
    Applicant: Korea Railroad Research Institute
    Inventors: SuYong CHOI, Jae Heon CHOI, Jung Youl LIM, Chang Young LEE, Kwan Sup LEE, Yong Jun JANG, Jeong Min JO, Jin Ho LEE, Min Hwan OK, Jae Hoon KIM, Lee Hyeon KIM
  • Publication number: 20200239036
    Abstract: Provided is a hypertube transport system. Specifically, provided are a magnetically-levitated train and an infrastructure-system in which same travels, comprising: refrigerant for cooling compressed air of a hypertube train, and a compressed air cooling system utilizing the refrigerant; an apparatus and method for controlling trains operating in a vacuum tube; superconducting switches for superconducting magnets for magnetic levitation; a driving stability apparatus for the hypertube transport system; a control apparatus for trains of the hypertube transport system; and an energy harvester.
    Type: Application
    Filed: August 28, 2018
    Publication date: July 30, 2020
    Inventors: Kwan Sup LEE, Young Jun JANG, Jae Hoon KIM, Chang Young LEE, Lee Hyeon KIM, Min Hwan OK, Jeong Min JO, Jin Ho LEE, Jung Youl LIM, Jae Heon CHOE, Su Yong CHOI
  • Patent number: 10157259
    Abstract: A method for predicting a failure rate of a semiconductor integrated circuit includes receiving a circuit netlist corresponding to circuit defining data, which defines a connection relation, input, output, size, type and operating temperature of each transistor of a plurality of transistors included in the semiconductor integrated circuit. Low-risk transistors having a low-failure probability among the plurality of transistors are detected and filtered out based on the circuit netlist. Failure rates are calculated of respective high-risk transistors other than the low-risk transistors among the plurality of transistors. A total failure rate of the semiconductor integrated circuit is calculated based on the failure rates of the respective high-risk transistors.
    Type: Grant
    Filed: January 17, 2017
    Date of Patent: December 18, 2018
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jeong Min Jo, Yoo Hwan Kim, Hye Won Shim, Sang Woo Pae
  • Publication number: 20180195967
    Abstract: Disclosed herein are a test instrument and a method of controlling the same, capable of performing a basic test on a sample of a patient, determining whether to perform an additional test, and displaying interfaces associated with a progress level, a necessary time, etc. of the additional test on a display unit when the additional test is performed, thereby enabling a user to visibly recognize information associated with a performing process of each test.
    Type: Application
    Filed: October 21, 2015
    Publication date: July 12, 2018
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Yu Ri SON, Eun Jeong JANG, Jeong Min JO
  • Patent number: 9880183
    Abstract: A test apparatus and a method for controlling the same are provided. The test apparatus may receive information about a reaction device, information about a storage environment, and external environment information from a storage storing a sample and a sensor sensing the external environment of the test apparatus. The test apparatus may perform a variety of control actions for testing the sample based on a temperature of and around the reaction device, resulting in increased reliability of the test result.
    Type: Grant
    Filed: November 4, 2015
    Date of Patent: January 30, 2018
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Eun Jeong Jang, Sung Hwa Lee, Jung Tae Lee, Jeong Min Jo
  • Patent number: 9869631
    Abstract: Disclosed are an analysis device and a method of determining a mounted state of a cartridge mounted in the analysis device. The analysis device includes: a mounting unit configured to mount a cartridge on which at least one well for containing a specimen is formed; a measuring unit configured to measure at least one signal corresponding to the at least one well formed on the cartridge; and an operation processor configured to process the at least one measured signal with respect to the at least one well measured by the measuring unit, wherein the operation processor determines a mounted state of the cartridge based on the at least one measured signal with respect to the at least one well formed on the cartridge.
    Type: Grant
    Filed: December 8, 2014
    Date of Patent: January 16, 2018
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jeong-min Jo, Tae-soo Kim, Sung-hwa Lee, Hyun-soo Jang
  • Publication number: 20170206302
    Abstract: A method for predicting a failure rate of a semiconductor integrated circuit includes receiving a circuit netlist corresponding to circuit defining data, which defines a connection relation, input, output, size, type and operating temperature of each of a plurality of transistors included in the semiconductor integrated circuit. Low-risk transistors having a low-failure probability among the plurality of transistors are detected and filtered out based on the circuit netlist. Failure rates are calculated of respective high-risk transistors other than the low-risk transistors among the plurality of transistors. A total failure rate of the semiconductor integrated circuit is calculated based on the failure rates of the respective high-risk transistors.
    Type: Application
    Filed: January 17, 2017
    Publication date: July 20, 2017
    Inventors: JEONG MIN JO, YOO HWAN KIM, HYE WON SHIM, SANG WOO PAE
  • Publication number: 20160187362
    Abstract: A test apparatus and a method for controlling the same are provided. The test apparatus may receive information about a reaction device, information about a storage environment, and external environment information from a storage storing a sample and a sensor sensing the external environment of the test apparatus. The test apparatus may perform a variety of control actions for testing the sample based on a temperature of and around the reaction device, resulting in increased reliability of the test result.
    Type: Application
    Filed: November 4, 2015
    Publication date: June 30, 2016
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Eun Jeong JANG, Sung Hwa LEE, Jung Tae LEE, Jeong Min JO
  • Publication number: 20150222188
    Abstract: Disclosed is a high frequency transformer for reducing leakage flux, including a voltage transformation unit for transforming a first voltage, which is inputted thereto, into a second voltage, wherein: a primary winding is divided; and a secondary winding is arranged between the divided primary windings.
    Type: Application
    Filed: December 22, 2014
    Publication date: August 6, 2015
    Inventors: Jeong Min JO, Young Jae HAN, Chang Young LEE, Hyun Seung JEONG, Sung Il SEO
  • Publication number: 20150211994
    Abstract: Disclosed are an analysis device and a method of determining a mounted state of a cartridge mounted in the analysis device. The analysis device includes: a mounting unit configured to mount a cartridge on which at least one well for containing a specimen is formed; a measuring unit configured to measure at least one signal corresponding to the at least one well formed on the cartridge; and an operation processor configured to process the at least one measured signal with respect to the at least one well measured by the measuring unit, wherein the operation processor determines a mounted state of the cartridge based on the at least one measured signal with respect to the at least one well formed on the cartridge.
    Type: Application
    Filed: December 8, 2014
    Publication date: July 30, 2015
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jeong-min JO, Tae-soo KIM, Sung-hwa LEE, Hyun-soo JANG
  • Publication number: 20150160137
    Abstract: An inspection apparatus including a detector configured to emit light to a chamber in which reaction of a sample and a reagent occurs and to detect an optical signal from the chamber, and a controller configured to acquire optical property data based on the detected optical signal and to predict inspection results using the optical property data acquired until a reference point in time.
    Type: Application
    Filed: December 9, 2014
    Publication date: June 11, 2015
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Sung Hwa LEE, Tae Soo KIM, Hyun Soo JANG, Jeong Min JO