Abstract: An apparatus and method for measuring air currents on the surface of a substrate, which can accurately measure the magnitude and direction of air currents on the surface of a wafer with wafer-type air current measurement sensors, are provided. The apparatus includes: a first air current measurement module measuring a magnitude of air currents on a surface of a first substrate, which is processed in accordance with a semiconductor manufacturing process; a second air current measurement module measuring a movement direction of the air currents; and a power module supplying power to the first and second air current measurement modules, wherein the first air current measurement module, the second air current measurement module, and the power module are mounted on a second substrate, which has the same shape as the first substrate.

Abstract: The present invention relates to an add-on architecture which can be applied to a network device. A network device for processing at least one or more applications, according to one embodiment of the present invention, comprises: a host S/W processing module which receives a key event for executing a specific command, and transmits the received key event to an add-on system manager, said add-on system manager which checks a focused specific application from among one or more applications currently being executed, and which transmits the received key event to the focused specific application; and an add-on application which processes the received key event.