Patents by Inventor Jeonghwan IN

Jeonghwan IN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250083993
    Abstract: A composition for eco-friendly infrared transmissive glass and a method for optical glass using the same are disclosed. According to an embodiment of the present invention, there is provided a method for manufacturing optical glass transmitting an infrared wavelength band of light by a preset reference value or more, comprising mixing preset contents of Ge, Ga, and Se and charging the mixture into a preset container, performing fusion on the preset container in a first preset environment, and gradually cooling the container in a second preset environment.
    Type: Application
    Filed: September 10, 2021
    Publication date: March 13, 2025
    Inventors: Juhyeon CHOI, Seonhoon KIM, Weesam LEE, Jeonghwan IN
  • Patent number: 9606065
    Abstract: Disclosed herein is a quantitative analysis method for measuring a target element in a specimen using laser-induced plasma spectrum. More particularly, the present invention relates to a method for analyzing a composition ratio of a target element by calculating peak intensities when peaks overlap each other in a spectrum, and a method for selecting a peak of a wavelength at which the highest precision and reproducibility are secured through linearity of a correlation plot of the peak intensities and a value by dividing a standard deviation value of calibration curve data (peak intensity ratios) by a slope when an internal standard method is used for quantitative analysis of a target element.
    Type: Grant
    Filed: December 12, 2013
    Date of Patent: March 28, 2017
    Assignee: GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Sungho Jeong, Jeonghwan In, Chan Kyu Kim, Seokhee Lee
  • Publication number: 20140168645
    Abstract: Disclosed herein is a quantitative analysis method for measuring a target element in a specimen using laser-induced plasma spectrum. More particularly, the present invention relates to a method for analyzing a composition ratio of a target element by calculating peak intensities when peaks overlap each other in a spectrum, and a method for selecting a peak of a wavelength at which the highest precision and reproducibility are secured through linearity of a correlation plot of the peak intensities and a value by dividing a standard deviation value of calibration curve data (peak intensity ratios) by a slope when an internal standard method is used for quantitative analysis of a target element.
    Type: Application
    Filed: December 12, 2013
    Publication date: June 19, 2014
    Applicant: GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Sungho JEONG, Jeonghwan IN, Chan Kyu KIM, Seokhee LEE