Abstract: A spectral imaging device (12) includes an image sensor (28), a tunable light source (14), an optical assembly (17), and a control system (30). The optical assembly (17) includes a first refractive element (24A) and a second refractive element (24B) that are spaced apart from one another by a first separation distance. The refractive elements (24A) (24B) have an element optical thickness and a Fourier space component of the optical frequency dependent transmittance function. Further, the element optical thickness of each refractive element (24A) (24B) and the first separation distance are set such that the Fourier space components of the optical frequency dependent transmittance function of each refractive element (24A) (24B) fall outside a Fourier space measurement passband.

Abstract: A spectral imaging device (12) includes an image sensor (28), an illumination source (14), a refractive, optical element (24A), a mover assembly (24C) (29), and a control system (30). The image sensor (28) acquires data to construct a two-dimensional spectral image (13A) during a data acquisition time (346). The illumination source (14) generates an illumination beam (16) that illuminates the sample (10) to create a modified beam (16I) that follow a beam path (16B) from the sample (10) to the image sensor (28). The refractive, optical element (24A) is spaced apart a separation distance (42) from the sample (10) along the beam path (16B). During the data acquisition time (346), the control system (30) controls the illumination source (14) to generate the illumination beam (16), controls the mover assembly (29) (24C) to modulate the separation distance (42), and controls the image sensor (28) to capture the data.

Abstract: A spectral imaging device (12) for generating an image (13A) of a sample (10) includes (i) an image sensor (30); (ii) a tunable light source (14) that generates an illumination beam (16) that is directed at the sample (10); (iii) an optical assembly (22) that collects light from the sample (10) and forms an image of the sample (10) on the image sensor (30); and (iv) a control system (32) that controls the tunable light source (14) and the image sensor (30). During a time segment, the control system (32) (i) controls the tunable light source (14) so that the illumination beam (16) has a center wavenumber that is modulated through a first target wavenumber with a first modulation rate; and (ii) controls the image sensor (30) to capture at least one first image at a first frame rate. Further, the first modulation rate is equal to or greater than the first frame rate.

Abstract: A mid-infrared objective lens assembly (10) includes a plurality of spaced apart, refractive lens elements (20) that operate in the mid-infrared spectral range, the plurality of lens elements (20) including an aplanatic first lens element (26) that is closest to an object (14) to be observed. The first lens element (26) has a forward surface (36) that faces the object (14) and a rearward surface (38) that faces away from the object (14). The forward surface (36) can have a radius of curvature that is negative.

Abstract: Spectrally analyzing an unknown sample (10A) for the existence of a characteristic includes (i) analyzing a first known sample (10C) having the characteristic and a second known sample (10D) not having the characteristic to identify less than fifty diagnostic spectral features, each diagnostic spectral feature being present at a different diagnostic wavelength in a mid-infrared spectral region; (ii) directing a plurality of interrogation beams (16) at the unknown sample (10A), each of the interrogation beams (16) having a different interrogation wavelength, and each interrogation wavelength corresponding to a different one of the diagnostic wavelengths; (iii) acquiring a plurality of separate output images (245) of the unknown sample (10A), wherein each of the output images (245) is acquired while the unknown sample is illuminated by a different one of the interrogation beams (16); and (iv) analyzing less than fifty output images (245) with a control system (28) to determine whether the characteristic is pres

Abstract: A mid-infrared objective lens assembly (10) includes a plurality of spaced apart, refractive lens elements (20) that operate in the mid-infrared spectral range, the plurality of lens elements (20) including an aplanatic first lens element (26) that is closest to an object (14) to be observed. The first lens element (26) has a forward surface (36) that faces the object (14) and a rearward surface (38) that faces away from the object (14). The forward surface (36) can have a radius of curvature that is negative.

Abstract: A spectral imaging device (12) includes an image sensor (28), a tunable light source (14), an optical assembly (17), and a control system (30). The optical assembly (17) includes a first refractive element (24A) and a second refractive element (24B) that are spaced apart from one another by a first separation distance. The refractive elements (24A) (24B) have an element optical thickness and a Fourier space component of the optical frequency dependent transmittance function. Further, the element optical thickness of each refractive element (24A) (24B) and the first separation distance are set such that the Fourier space components of the optical frequency dependent transmittance function of each refractive element (24A) (24B) fall outside a Fourier space measurement passband.

Abstract: Spectrally analyzing an unknown sample (10A) includes (i) providing a spatially homogeneous region (10B) of the unknown sample (10A); (ii) directing a plurality of interrogation beams (16) at the spatially homogeneous region (10B) with a laser source (14), (iii) acquiring a separate output image (245) while the unknown sample (10A) is illuminated by each of the interrogation beams (16) with an image sensor (26A); and (iv) analyzing less than fifty output images (245) to analyze whether a characteristic is present in the unknown sample (10A) with a control system (28) that includes a processor. Each of the interrogation beams (16) is nominally monochromatic and has a different interrogation wavelength that is in the mid-infrared spectral range.

Abstract: Spectrally analyzing an unknown sample (10A) includes (i) providing a spatially homogeneous region (10B) of the unknown sample (10A); (ii) directing a plurality of interrogation beams (16) at the spatially homogeneous region (10B) with a laser source (14), (iii) acquiring a separate output image (245) while the unknown sample (10A) is illuminated by each of the interrogation beams (16) with an image sensor (26A); and (iv) analyzing less than fifty output images (245) to analyze whether a characteristic is present in the unknown sample (10A) with a control system (28) that includes a processor. Each of the interrogation beams (16) is nominally monochromatic and has a different interrogation wavelength that is in the mid-infrared spectral range.

Abstract: An imaging microscope for spectrally analyzing a sample includes (i) a laser source that generates an interrogation beam; (ii) an attenuated total reflection assembly that includes an ATR crystal and a sample holder that holds the sample in intimate contact with the ATR crystal; (iii) an objective lens assembly that collects a reflected beam and focuses the reflected beam; and (iv) a two dimensional image sensor that receives the focused, reflected beam and captures two dimensional image information that is used to generate an image of the sample, the image sensor being operable in the mid-infrared range.

Abstract: A spectral imaging device (12) includes an image sensor (28), a tunable light source (14), an optical assembly (17), and a control system (30). The optical assembly (17) includes a first refractive element (24A) and a second refractive element (24B) that are spaced apart from one another by a first separation distance. The refractive elements (24A) (24B) have an element optical thickness and a Fourier space component of the optical frequency dependent transmittance function. Further, the element optical thickness of each refractive element (24A) (24B) and the first separation distance are set such that the Fourier space components of the optical frequency dependent transmittance function of each refractive element (24A) (24B) fall outside a Fourier space measurement passband.

Abstract: A spectral imaging device (12) includes an image sensor (28), an illumination source (14), a refractive, optical element (24A), a mover assembly (24C) (29), and a control system (30). The image sensor (28) acquires data to construct a two-dimensional spectral image (13A) during a data acquisition time (346). The illumination source (14) generates an illumination beam (16) that illuminates the sample (10) to create a modified beam (16I) that follow a beam path (16B) from the sample (10) to the image sensor (28). The refractive, optical element (24A) is spaced apart a separation distance (42) from the sample (10) along the beam path (16B). During the data acquisition time (346), the control system (30) controls the illumination source (14) to generate the illumination beam (16), controls the mover assembly (29) (24C) to modulate the separation distance (42), and controls the image sensor (28) to capture the data.

Abstract: An assembly (12) for rapid thermal data acquisition of a sample (10) includes a laser source (14), a light sensing device (26), and a control system (28). The laser source (14) emits a laser beam (16) that is directed at the sample (10), the laser beam (16) including a plurality of pulses (233). The light sensing device (26) senses mid-infrared light from the sample (10), the light sensing device (26) including a pixel array (348). The control system (28) controls the light sensing device (26) to capture a plurality of sequential readouts (402) from the pixel array (348) with a substantially steady periodic readout acquisition rate 405. The control system (28) can generate a spectral cube (13) using information from the readouts (402).

Abstract: A mid-infrared objective lens assembly (10) includes a plurality of spaced apart, refractive lens elements (20) that operate in the mid-infrared spectral range, the plurality of lens elements (20) including an aplanatic first lens element (26) that is closest to an object (14) to be observed. The first lens element (26) has a forward surface (36) that faces the object (14) and a rearward surface (38) that faces away from the object (14). The forward surface (36) can have a radius of curvature that is negative.

Abstract: Spectrally analyzing an unknown sample (10A) includes (i) providing a spatially homogeneous region (10B) of the unknown sample (10A); (ii) directing a plurality of interrogation beams (16) at the spatially homogeneous region (10B) with a laser source (14), (iii) acquiring a separate output image (245) while the unknown sample (10A) is illuminated by each of the interrogation beams (16) with an image sensor (26A); and (iv) analyzing less than fifty output images (245) to analyze whether a characteristic is present in the unknown sample (10A) with a control system (28) that includes a processor. Each of the interrogation beams (16) is nominally monochromatic and has a different interrogation wavelength that is in the mid-infrared spectral range.

Abstract: A laser assembly (12) for providing an output beam (18) includes a gain medium (16) and a laser housing (20) that retains the gain medium (16). The gain medium (16) generates the output beam (18) when electrical power is directed to the gain medium (16). The laser housing (20) includes a reference redirector (20A) that is used to a reference datum to check the alignment of the output beam (18) relative to the laser housing (20). The reference redirector (20A) can be a mirror that is integrated into the laser housing.

Abstract: A laser assembly (12) for providing an output beam (18) includes a gain medium (16) and a laser housing (20) that retains the gain medium (16). The gain medium (16) generates the output beam (18) when electrical power is directed to the gain medium (16). The laser housing (20) includes a reference redirector (20A) that is used to a reference datum to check the alignment of the output beam (18) relative to the laser housing (20). The reference redirector (20A) can be a mirror that is integrated into the laser housing.

Abstract: Integrated circuit and integrated circuit device diagnostic methods and apparatus in accordance with the present invention are provided. The IC is operated to produce an output marginally above a pass-fail threshold for a particular performance criteria. The IC is made to fail that criteria by inducing an electrical stress in an IC device that is of marginal design for that particular criteria. The electrical stress acts to minutely degrade the performance of the IC device driving the IC below the pass-fail threshold. When each IC device is stressed in accordance with the embodiments of the present invention, marginal IC devices are identified to enable the design to be modified. The induced electrical stress is non-destructive to the IC device and IC, which permits a repeatable diagnostic process, as well as allows for the diagnostic testing of other IC devices in the same microcircuit.

Abstract: Integrated circuit and integrated circuit device diagnostic methods and apparatus in accordance with the present invention are provided. The IC is operated to produce an output marginally above a pass-fail threshold for a particular performance criteria. The IC is made to fail that criteria by inducing an electrical stress in an IC device that is of marginal design for that particular criteria. The electrical stress acts to minutely degrade the performance of the IC device driving the IC below the pass-fail threshold. When each IC device is stressed in accordance with the embodiments of the present invention, marginal IC devices are identified to enable the design to be modified. The induced electrical stress is non-destructive to the IC device and IC, which permits a repeatable diagnostic process, as well as allows for the diagnostic testing of other IC devices in the same microcircuit.

Abstract: An apparatus for fabricating encapsulated micro-channels in a substrate is described. The apparatus includes the formation of a thin film layer over an area of a substrate. Following the formation of the thin layer, a periodic array of access windows are formed within the thin film layer along dimensions of one or more desired micro-channels. Following formation of the access windows, the one or more micro-channels are formed within an underlying layer of the substrate. Finally, the one or more micro-channels are encapsulated, thereby closing the one or more access windows along the dimensions of the desired micro-channels. Accordingly, the apparatus is suitable in one context for rapid prototyping of micro-electromechanical systems in the areas of, for example, RF micro-systems, fluidic micro-systems and bio-fluidic applications. In addition, the apparatus enables the rapid prototyping of integrated circuits.