Patents by Inventor Jeremy Bellay
Jeremy Bellay has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20250191172Abstract: In an approach to non-destructive inspection of IC devices, one or more images of a Device Under Test (DUT) are received from one or more imaging devices. Observed features are detected in the one or more images and producing a first synthetic representation of a part design of the DUT that includes the observed features. The presence of one or more first unobserved features are inferred, where the one or more first unobserved features are inferred using a mapping and inference model (MIM). The one or more first unobserved features are added to the first synthetic representation of the part design of the DUT.Type: ApplicationFiled: February 12, 2025Publication date: June 12, 2025Inventors: Nicholas Darby, Jeremiah Schley, Jeremy Bellay
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Publication number: 20250181040Abstract: In an approach to CRAI and risk framework for manufacturing applications, there is thus provided a computer-implemented method for causal effect prediction, the computer-implemented method including: identifying, by one or more computer processors, an intervention, wherein the intervention is selected from the group consisting of threats, failures, corrections, and relevant outputs; collecting, by the one or more computer processors, process dependency data; creating, by the one or more computer processors, an intervention model; combining, by the one or more computer processors, the process dependency data and the intervention model to create a combined process dependency graph; training, by the one or more computer processors, a causal relational artificial intelligence (CRAI) model; and determining, by the one or more computer processors, an estimate of an intervention efficacy.Type: ApplicationFiled: February 13, 2025Publication date: June 5, 2025Inventors: Jeremy Bellay, Shelly DeForte, Nicholas Darby, Kurtis Wickey
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Patent number: 12298343Abstract: A method of designing a robust integrated circuit that is not vulnerable to optical fault injection comprises training a variational autoencoder to identify regions in a target integrated circuit that are vulnerable to optical fault injection and altering the design of the target integrated circuit by altering the design of the vulnerable regions so that the target integrated circuit is no longer vulnerable to optical fault injection, thereby forming the robust integrated circuit.Type: GrantFiled: March 23, 2021Date of Patent: May 13, 2025Assignee: Battelle Memorial InstituteInventors: Adam Gakuto Kimura, Jeremy Bellay, Thomas Kent
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Publication number: 20250124285Abstract: A method implemented by a software for a multimodal evaluation engine stored on a memory is provided herein. The software is executable by a processor coupled to the memory to cause the method. The method includes receiving multimodal signatures of an object of interest from inspection elements and processing the multimodal signatures to transform the multimodal signatures into formats. The method also includes generating data representations of the formats and detecting whether anomalies are present within the object of interest based on the data representations.Type: ApplicationFiled: December 20, 2024Publication date: April 17, 2025Applicant: Battelle Memorial InstituteInventors: Anthony George, Nicholas Darby, Jeremy Bellay, David Collins, Katie Liszewski, Amir Rahimi
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Patent number: 12253837Abstract: In an approach to CRAI and risk framework for manufacturing applications, a computer-implemented method for causal effect prediction includes identifying, by one or more computer processors, an intervention, where the intervention is selected from the group consisting of threats, failures, corrections, and relevant outputs; collecting, by the one or more computer processors, process dependency data; creating, by the one or more computer processors, an intervention model; combining, by the one or more computer processors, the process dependency data and the intervention model to create a combined process dependency graph; training, by the one or more computer processors, a causal relational artificial intelligence (CRAI) model; and determining, by the one or more computer processors, an estimate of an intervention efficacy.Type: GrantFiled: April 22, 2022Date of Patent: March 18, 2025Assignee: Battelle Memorial InstituteInventors: Jeremy Bellay, Shelly DeForte, Nicholas Darby, Kurtis Wickey
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Patent number: 12254613Abstract: In an approach to non-destructive inspection of IC devices, one or more images of a Device Under Test (DUT) are received from one or more imaging devices. Observed features are detected in the one or more images and producing a first synthetic representation of a part design of the DUT that includes the observed features. The presence of one or more first unobserved features are inferred, where the one or more first unobserved features are inferred using a mapping and inference model (MIM). The one or more first unobserved features are added to the first synthetic representation of the part design of the DUT.Type: GrantFiled: February 14, 2024Date of Patent: March 18, 2025Assignee: Battelle Memorial InstituteInventors: Nicholas Darby, Jeremiah Schley, Jeremy Bellay
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Patent number: 12217170Abstract: A method implemented by a software for a multimodal evaluation engine stored on a memory is provided herein. The software is executable by a processor coupled to the memory to cause the method. The method includes receiving multimodal signatures of an object of interest from inspection elements and processing the multimodal signatures to transform the multimodal signatures into formats. The method also includes generating data representations of the formats and detecting whether anomalies are present within the object of interest based on the data representations.Type: GrantFiled: March 29, 2021Date of Patent: February 4, 2025Assignee: Battelle Memorial InstituteInventors: Anthony George, Nicholas Darby, Jeremy Bellay, David Collins, Katie Liszewski, Amir Rahimi
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Publication number: 20240185408Abstract: In an approach to non-destructive inspection of IC devices, one or more images of a Device Under Test (DUT) are received from one or more imaging devices. Observed features are detected in the one or more images and producing a first synthetic representation of a part design of the DUT that includes the observed features. The presence of one or more first unobserved features are inferred, where the one or more first unobserved features are inferred using a mapping and inference model (MIM). The one or more first unobserved features are added to the first synthetic representation of the part design of the DUT.Type: ApplicationFiled: February 14, 2024Publication date: June 6, 2024Inventors: Nicholas Darby, Jeremiah Schley, Jeremy Bellay
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Patent number: 11941797Abstract: In an approach to non-destructive inspection of IC devices, one or more images of a Device Under Test (DUT) are received from one or more imaging devices. Observed features are detected in the one or more images and producing a first synthetic representation of a part design of the DUT that includes the observed features. The presence of one or more first unobserved features are inferred, where the one or more first unobserved features are inferred using a mapping and inference model (MIM). The one or more first unobserved features are added to the first synthetic representation of the part design of the DUT.Type: GrantFiled: March 3, 2022Date of Patent: March 26, 2024Assignee: Battelle Memorial InstituteInventors: Nicholas Darby, Jeremiah Schley, Jeremy Bellay
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Publication number: 20220342371Abstract: In an approach to CRAI and risk framework for manufacturing applications, there is thus provided a computer-implemented method for causal effect prediction, the computer-implemented method including: identifying, by one or more computer processors, an intervention, wherein the intervention is selected from the group consisting of threats, failures, corrections, and relevant outputs; collecting, by the one or more computer processors, process dependency data; creating, by the one or more computer processors, an intervention model; combining, by the one or more computer processors, the process dependency data and the intervention model to create a combined process dependency graph; training, by the one or more computer processors, a causal relational artificial intelligence (CRAI) model; and determining, by the one or more computer processors, an estimate of an intervention efficacy.Type: ApplicationFiled: April 22, 2022Publication date: October 27, 2022Inventors: Jeremy Bellay, Shelly DeForte, Nicholas Darby, Kurtis Wickey
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Publication number: 20220284568Abstract: In an approach to non-destructive inspection of IC devices, one or more images of a Device Under Test (DUT) are received from one or more imaging devices. Observed features are detected in the one or more images and producing a first synthetic representation of a part design of the DUT that includes the observed features. The presence of one or more first unobserved features are inferred, where the one or more first unobserved features are inferred using a mapping and inference model (MIM). The one or more first unobserved features are added to the first synthetic representation of the part design of the DUT.Type: ApplicationFiled: March 3, 2022Publication date: September 8, 2022Inventors: Nicholas Darby, Jeremiah Schley, Jeremy Bellay
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Publication number: 20210304002Abstract: A method implemented by a software for a multimodal evaluation engine stored on a memory is provided herein. The software is executable by a processor coupled to the memory to cause the method. The method includes receiving multimodal signatures of an object of interest from inspection elements and processing the multimodal signatures to transform the multimodal signatures into formats. The method also includes generating data representations of the formats and detecting whether anomalies are present within the object of interest based on the data representations.Type: ApplicationFiled: March 29, 2021Publication date: September 30, 2021Applicant: Battelle Memorial InstituteInventors: Anthony George, Nicholas Darby, Jeremy Bellay, David Collins, Katie Liszewski, Amir Rahimi