Patents by Inventor Jeremy Jenum

Jeremy Jenum has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Automated wafer defect inspection system using backside illumination
    Patent number: 7629993
    Abstract: A defect inspection system for the semiconductor and microelectronics industry. More particularly, the present invention relates to an automated defect inspection system for wafers or other semiconductor or electronic substrates of any kind or type that are transparent, translucent, opaque or otherwise capable of allowing at least some light to pass through.
    Type: Grant
    Filed: September 30, 2002
    Date of Patent: December 8, 2009
    Assignee: Rudolph Technologies, Inc.
    Inventors: Mark Harless, Jeremy Jenum, Willard Charles Raymond
  • Automated wafer defect inspection system using backside illumination
    Publication number: 20040061779
    Abstract: A defect inspection system for the semiconductor and microelectronics industry. More particularly, the present invention relates to an automated defect inspection system for wafers or other semiconductor or electronic substrates of any kind or type that are transparent, translucent, opaque or otherwise capable of allowing at least some light to pass through.
    Type: Application
    Filed: September 30, 2002
    Publication date: April 1, 2004
    Inventors: Mark Harless, Jeremy Jenum, Willard Charles Raymond