Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: An edge clock model is used to capture states from a logic-level simulation of a circuit description. The states are captured at clock edges, or transitions, according to an edge clock model based on a clock specification for the circuit description. The captured states and associated attributes are used in formal verification of the circuit description. This approach helps to reduce or eliminate inaccuracies and other issues with other clock models such as a phase clock model. In one embodiment, a phase clock model can be used in addition to the edge clock model. In another embodiment, the edge clock states can be used to generate states according to different clock models, such as the phase clock model.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: An edge clock model is used to capture states from a logic-level simulation of a circuit description. The states are captured at clock edges, or transitions, according to an edge clock model based on a clock specification for the circuit description. The captured states and associated attributes are used in formal verification of the circuit description. This approach helps to reduce or eliminate inaccuracies and other issues with other clock models such as a phase clock model. In one embodiment, a phase clock model can be used in addition to the edge clock model. In another embodiment, the edge clock states can be used to generate states according to different clock models, such as the phase clock model.

Abstract: An edge clock model is used to capture states from a logic-level simulation of a circuit description. The states are captured at clock edges, or transitions, according to an edge clock model based on a clock specification for the circuit description. The captured states and associated attributes are used in formal verification of the circuit description. This approach helps to reduce or eliminate inaccuracies and other issues with other clock models such as a phase clock model. In one embodiment, a phase clock model can be used in addition to the edge clock model. In another embodiment, the edge clock states can be used to generate states according to different clock models, such as the phase clock model.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: An edge clock model is used to capture states from a logic-level simulation of a circuit description. The states are captured at clock edges, or transitions, according to an edge clock model based on a clock specification for the circuit description. The captured states and associated attributes are used in formal verification of the circuit description. This approach helps to reduce or eliminate inaccuracies and other issues with other clock models such as a phase clock model. In one embodiment, a phase clock model can be used in addition to the edge clock model. In another embodiment, the edge clock states can be used to generate states according to different clock models, such as the phase clock model.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicated that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.