Abstract: A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips. An alignment assembly for aligning a probe with respect to a device to be tested includes a first alignment block, a second alignment block, and an alignment piece connecting the first alignment block and the second alignment block. The first alignment block and the second alignment block are arranged to be attached to the device to be tested to align the probe with respect to the device to be tested.

Abstract: A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips.

Abstract: A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips.

Abstract: A socket that electrically connects a memory drive unit to a circuit board includes a socket housing including a base portion having a slot disposed in a central portion therein, sidewalls extending upward from the base portion, and end walls extending upward from the base portion and between the sidewalls, and a locking member arranged to engage a locking structure of a memory drive unit when a memory drive unit is inserted into the memory drive socket. The slot includes a plurality of contacts disposed therein which are arranged to engage corresponding contact pads of the memory drive unit. A bottom surface of the base portion includes at least one pin arranged to engage a through hole of a circuit board. The locking member includes at least one pin disposed at a lower end portion thereof and arranged to be secured to the circuit board.

Abstract: A right angle electrical connector assembly includes a connector frame including a plurality of posts, each of the plurality of posts including at least one standoff rib extending therefrom, a flexible circuit having a first end portion and a second end portion, the second end portion being arranged to be connected to a circuit board. The flexible circuit includes a plurality of holes arranged to correspond to the plurality of posts, each of the plurality of posts is received in a respective one of the plurality of holes, and a height of a first major surface of the second end portion of the flexible circuit is set by the at least one standoff rib of each of the plurality of posts.

Abstract: A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips.