Abstract: A system for detecting and correcting hardware failures in electrochromic devices is described. The system may include a memory to store data and a processing device coupled to the memory. The processing device causes a tinting state of an electrochromic device to correspond to a first tinting state, receives first sensor data corresponding to a first point in time after causing the tinting state to correspond to the first tinting state, and receives second sensor data corresponding to a second point in time that is a period of time after the first point in time. The period of time is without directing change of tinting state of the electrochromic device. In response to determining, based on the first and second sensor data, that a corrective action is to be performed for the electrochromic device, the processing device causes the corrective action to be performed for the electrochromic device.

Abstract: Quality control of an electrochromic device is described. A method may be subsequent to a stage of manufacturing of an electrochromic device. The method may include directing a current tinting state of the electrochromic device to correspond to a first tinting state and receiving sensor data associated with the directing of the current tinting state of the electrochromic device to correspond to the first tinting state. The method may further include determining, based on the sensor data, whether a corrective action is to be performed for the electrochromic device and, responsive to determining the corrective action is to be performed, cause the corrective action to be performed.