Patents by Inventor Jeroen Baert

Jeroen Baert has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10712325
    Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield pheno-type of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.
    Type: Grant
    Filed: July 18, 2019
    Date of Patent: July 14, 2020
    Assignee: BASF PLANT SCIENCE COMPANY GMBH
    Inventors: Pierre Lejeune, Jeroen Baert, Frederik Leyns, Joris Eeckhout
  • Publication number: 20190346419
    Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield pheno-type of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.
    Type: Application
    Filed: July 18, 2019
    Publication date: November 14, 2019
    Inventors: Pierre Lejeune, Jeroen Baert, Frederik Leyns, Joris Eeckhout
  • Patent number: 10393719
    Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield phenotype of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.
    Type: Grant
    Filed: December 6, 2016
    Date of Patent: August 27, 2019
    Assignee: BASF PLANT SCIENCE COMPANY GMBH
    Inventors: Pierre Lejeune, Jeroen Baert, Frederik Leyns, Joris Eeckhout
  • Publication number: 20180356385
    Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield phenotype of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.
    Type: Application
    Filed: December 6, 2016
    Publication date: December 13, 2018
    Inventors: Pierre Lejeune, Jeroen Baert, Frederik Leyns, Joris Eeckhout
  • Patent number: 9335252
    Abstract: A screening device (110) for screening at least one plant specimen (112) in a plurality of plant specimens (114) is disclosed. The screening device (110) comprises a detector (116) adapted for acquiring spatially resolved images (117). The screening device (110) further comprises at least one selection device (118) adapted for selecting a single plant specimen (120) or a group of plant specimens (122) from the plurality of plant specimens (114) for imaging by the detector (116). The selection device (118) comprises a deflection device (124) adapted for deflecting electromagnetic waves propagating between the plant specimens (112) and the detector (116).
    Type: Grant
    Filed: June 4, 2015
    Date of Patent: May 10, 2016
    Assignee: BASF Plant Science Company GmbH
    Inventors: Frederik Leyns, Cédrick Vandaele, Pierre Lejeune, Jeroen Baert, Fabio Fiorani
  • Publication number: 20150268156
    Abstract: A screening device (110) for screening at least one plant specimen (112) in a plurality of plant specimens (114) is disclosed. The screening device (110) comprises a detector (116) adapted for acquiring spatially resolved images (117). The screening device (110) further comprises at least one selection device (118) adapted for selecting a single plant specimen (120) or a group of plant specimens (122) from the plurality of plant specimens (114) for imaging by the detector (116). The selection device (118) comprises a deflection device (124) adapted for deflecting electromagnetic waves propagating between the plant specimens (112) and the detector (116).
    Type: Application
    Filed: June 4, 2015
    Publication date: September 24, 2015
    Inventors: Frederik Leyns, Cédrick VANDAELE, Pierre LEJEUNE, Jeroen BAERT, Fabio FIORANI
  • Patent number: 9074989
    Abstract: A screening device (110) for screening at least one plant specimen (112) in a plurality of plant specimens (114) is disclosed. The screening device (110) comprises a detector (116) adapted for acquiring spatially resolved images (117). The screening device (110) further comprises at least one selection device (118) adapted for selecting a single plant specimen (120) or a group of plant specimens (122) from the plurality of plant specimens (114) for imaging by the detector (116). The selection device (118) comprises a deflection device (124) adapted for deflecting electromagnetic waves propagating between the plant specimens (112) and the detector (116).
    Type: Grant
    Filed: June 25, 2012
    Date of Patent: July 7, 2015
    Assignee: BASF Plant Science Company GmbH
    Inventors: Frederik Leyns, Cádrick Vandaele, Pierre Lejeune, Jeroen Baert, Fabio Fiorani
  • Publication number: 20140154729
    Abstract: A screening device (110) for screening at least one plant specimen (112) in a plurality of plant specimens (114) is disclosed. The screening device (110) comprises a detector (116) adapted for acquiring spatially resolved images (117). The screening device (110) further comprises at least one selection device (118) adapted for selecting a single plant specimen (120) or a group of plant specimens (122) from the plurality of plant specimens (114) for imaging by the detector (116). The selection device (118) comprises a deflection device (124) adapted for deflecting electromagnetic waves propagating between the plant specimens (112) and the detector (116).
    Type: Application
    Filed: June 25, 2012
    Publication date: June 5, 2014
    Applicant: BASF Plant Science Company GmbH
    Inventors: Frederik Leyns, Cédrick Vandaele, Pierre Lejeune, Jeroen Baert, Fabio Fiorani