Patents by Inventor Jeroen KEIZER

Jeroen KEIZER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240055222
    Abstract: The invention relates to a system for sensor protection in electron imaging applications comprising a beam control device configured to provide a beam signal based on an incoming beam signal, wherein the beam signal comprises an altered beam intensity, wherein the beam control device is further configured to receive a control signal and to activate based on the control signal. The system further comprises a sensor configured to capture the beam signal and to provide a capture signal based on the beam signal, and a control module configured to provide the control signal to the beam control device, to generate an exposure value based on the capture signal and to modify the control signal based on the exposure value.
    Type: Application
    Filed: August 9, 2023
    Publication date: February 15, 2024
    Inventors: Peter Christiaan Tiemeijer, Erwin de Jong, Andrei Radulescu, James McCormack, Jeroen Keizer
  • Publication number: 20230179885
    Abstract: Techniques for acquiring an electron energy loss spectrum in two dimensions are disclosed herein. The technique at least includes exposing an electron sensor to an electron spectrum projected in two dimensions, wherein one of the two dimensions corresponds to a dispersive axis, and the other of the two dimensions corresponds to a non-dispersive axis, receiving an electron sensor readout frame from the electron sensor, where the electron sensor readout frame comprises a plurality of values representative of the electron spectrum in each of the two dimensions, and reducing a resolution of the electron sensor readout frame in at least one of the two dimensions, where reducing the resolution includes reducing the number of values in the at least one of the two dimensions, where the electron sensor readout frame comprises a plurality of values in each of the two dimensions after the reduction in resolution.
    Type: Application
    Filed: December 8, 2021
    Publication date: June 8, 2023
    Applicant: FEI Company
    Inventors: Jeroen KEIZER, Francis-Paul JANSSEN, Jacob Simon FABER
  • Patent number: 11297276
    Abstract: A method and system for acquiring data from a pixelated image sensor for detecting charged particles. The method includes reading a pixel voltage of one or more of the multiple pixels multiple times without resetting the image sensor and digitizing the pixel into a first number of bits. The camera outputs a digitized compressed pixel voltage in a second, less, number of bits. The maximum range of the digitized compressed pixel voltage is less than a maximum range of the pixel voltage.
    Type: Grant
    Filed: September 30, 2020
    Date of Patent: April 5, 2022
    Assignee: FEI Company
    Inventors: Henricus Gerardus Roeven, Rob Braan, Bart Jozef Janssen, Jeroen Keizer
  • Publication number: 20220103771
    Abstract: A method and system for acquiring data from a pixelated image sensor for detecting charged particles. The method includes reading a pixel voltage of one or more of the multiple pixels multiple times without resetting the image sensor and digitizing the pixel into a first number of bits. The camera outputs a digitized compressed pixel voltage in a second, less, number of bits. The maximum range of the digitized compressed pixel voltage is less than a maximum range of the pixel voltage.
    Type: Application
    Filed: September 30, 2020
    Publication date: March 31, 2022
    Applicant: FEI Company
    Inventors: Henricus Gerardus ROEVEN, Rob BRAAN, Bart Jozef JANSSEN, Jeroen KEIZER