Abstract: There are provided monitors which sense a magnitude of power (and/or energy) being consumed by a facility and which sense a magnitude of power (and/or energy) being produced by at least one energy-producing system. There are provided facilities comprising at least one main panel bus, at least one external power line, at least one energy-producing system, at least one critical load sub-panel bus and at least one monitor which senses a magnitude of power (and/or energy) being consumed by the facility and a magnitude of power (and/or energy) being produced by the at least one energy-producing system. There are provided methods of monitoring power (and/or energy) consumed and power (and/or energy) produced in a facility, and devices which display magnitude of power (and/or energy) being consumed and magnitude of power (and/or energy) being produced in a battery.

Abstract: A method and apparatus for applying contacts to a semiconductor substrate, comprising one or more applicator rolls. Each applicator roll comprises a printing surface which has at least one raised pattern surface. Each raised first pattern surface is positioned such that upon rotation of the first rotatable applicator roll, it passes through a printing space. As a result, a surface of a semiconductor substrate passing through the printing space while the raised pattern surface(s) is covered with a conductive ink and the applicator roll is being rotated comes into contact with the conductive ink on at least part of the raised pattern surface, and does not come into contact with conductive ink on substantially any of the printing surface other than the raised pattern surface. Accordingly, a conductive ink pattern is deposited on the semiconductor substrate surface. In a preferred aspect, the conductive ink is a hot melt ink.