Abstract: A coplanar test fixture facilitates fixturing and high speed automatic testing of planar electronic devices, such as high density interconnect (HDI) modules, having a plurality of contact pads on a major surface thereof. The fixture includes, for interfacing to automatic test equipment (ATE), an ATE load board, and a customized printed circuit load card situated coplanarly within an aperture in the load board. The load card has an aperture for receiving, coplanarly, a device under test. Metal-on-elastomer (MOE) conductor assemblies make electrical contact between the load board and outer contacts on the load card, and between inner contacts on the load card and contacts of the device under test. Clamping devices secure the conductor assemblies to the load board, the load card and the electronic device under test, and secure the load board, the load card and the electronic device to each other.