Abstract: A clock and data recovery device (CDR) based on multi-rate multi-phase oversampling technique is capable of receiving serial data streams of different data rates. The CDR uses a multi-rate multi-phase oversampling technique. N phase shifted clocks are generated based on a single clock and rising edges (or falling) of the phase shifted clocks and define N sampling points where a serial data stream is sampled. The multi-phase oversampling technique provides at least two sampling points per data bit of the serial data stream at highest data rates. The sampling points divide one clock cycle of the single clock into N zones. Depending on which of the zones a data edge transition is detected, the CDR can converge the sampling points to optimal data sampling positions in the serial data stream.

Abstract: A clock and data recovery device (CDR) based on multi-rate multi-phase oversampling technique is capable of receiving serial data streams of different data rates. The CDR uses a multi-rate multi-phase oversampling technique. N phase shifted clocks are generated based on a single clock and rising edges (or falling) of the phase shifted clocks and define N sampling points where a serial data stream is sampled. The multi-phase oversampling technique provides at least two sampling points per data bit of the serial data stream at highest data rates. The sampling points divide one clock cycle of the single clock into N zones. Depending on which of the zones a data edge transition is detected, the CDR can converge the sampling points to optimal data sampling positions in the serial data stream.

Abstract: When used as a test data generator, CDR internal structures may be applied to generate drift conditions in the test data. For example, a finite state machine phase shifts a clock signal, over time, driving the test data generator thereby producing a drift condition on the test data. Once the test is completed, one of the other CDRs may be used as a tester to similarly generate test data for the first CDR. CDRs may be configured in pairs for this purpose so that one may be used to test the other.

Abstract: A device for phase alignment between a data signal and a main clock signal, characterized by the fact that, from a main clock signal, it has some means of generation of clock signals which are phase-shifted with respect to one another by a fraction of a period of said main clock signal, some means 10 of dividing the input data signal by sampling of said signal by said clock signals in order to obtain data signals with a length equal to said fraction of a period of said main clock signal, observation window 14 of said sampled data bits, said window 14 having a length equal to a data bit of the entering signal, a set of pipelines 16 for parallel processing using an algorithm of the signals transmitted by the observation window in view of retrieving data signals, and device 18, 19 for drift compensation.

Abstract: A device for phase alignment between a data signal and a main clock signal, characterized by the fact that, from a main clock signal, it has some means of generation of clock signals which are phase-shifted with respect to one another by a fraction of a period of said main clock signal, some means 10 of dividing the input data signal by sampling of said signal by said clock signals in order to obtain data signals with a length equal to said fraction of a period of said main clock signal, observation window 14 of said sampled data bits, said window 14 having a length equal to a data bit of the entering signal, a set of pipelines 16 for parallel processing using an algorithm of the signals transmitted by the observation window in view of retrieving data signals, and device 18, 19 for drift compensation.