Patents by Inventor Jerrell Anthony Nardiello

Jerrell Anthony Nardiello has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • In-situ large area optical strain measurement using an encoded dot pattern
    Patent number: 7377181
    Abstract: A method of measuring strain in a test specimen comprises the steps of placing a pattern of marks on a surface of the test specimen, wherein the pattern of marks includes a plurality of target marks and a plurality of sets of coded marks, using the sets of coded marks to identify locations of at least two of the target marks, and using a change in distance between at least two of the marks to determine strain in the test specimen. An apparatus that performs the method is also provided.
    Type: Grant
    Filed: March 10, 2006
    Date of Patent: May 27, 2008
    Assignee: Northrop Grumman Corporation
    Inventors: Robert J. Christ, Jr., Jerrell Anthony Nardiello, John M. Papazian, John Steven Madsen