Patents by Inventor Jerry A. Thomas

Jerry A. Thomas has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems, methods and apparatus for determining deviation of an x-ray field, a light field and a primary receptor
    Patent number: 7176467
    Abstract: Systems, methods and apparatus are provided through which, in some embodiments, an electronic sensor is positioned in the field of projection of an X-ray source, and the electronic sensor measures the deviation between a visible light field and an X-ray field. In some embodiments, the deviation is scaled in reference to the position of the electronic sensor between an X-ray receptor and the X-ray source.
    Type: Grant
    Filed: December 2, 2004
    Date of Patent: February 13, 2007
    Assignee: General Electric Company
    Inventors: John Michael Sandrik, Rowland F. Saunders, Jerry A. Thomas
  • Method and apparatus for calibrating an imaging system
    Patent number: 6632020
    Abstract: A method for calibration of an imaging system includes providing a calibration phantom system including a first phantom element material block having a first surface at a first height, wherein the first phantom element material block at least partially includes a first material having a first attenuation coefficient. Providing a calibration phantom system also includes providing a second phantom element material block having a second surface at a second height different than the first height, the second phantom element material block at least partially including a second material having a second attenuation coefficient different than the first attenuation coefficient, wherein the first phantom element material block and said second phantom element material block are co-positioned on a detector. The method also includes imaging the calibration phantom system to obtain phantom images, processing the phantom images, and extracting a plurality of calibration values from the processed phantom images.
    Type: Grant
    Filed: October 12, 2001
    Date of Patent: October 14, 2003
    Assignee: General Electric Company
    Inventors: John Patrick Kaufhold, John Eric Tkaczyk, Dinko E. Gonzalez Trotter, Jeffrey Wayne Eberhard, Jerry A. Thomas
  • Method and apparatus for calibrating an imaging system
    Publication number: 20030072417
    Abstract: A method for calibration of an imaging system, the imaging system including a radiation source and a digital detector. The method includes providing a calibration phantom system including a first phantom element material block having a first surface at a first height, wherein the first phantom element material block at least partially includes a first material having a first attenuation coefficient. Providing a calibration phantom system also includes providing a second phantom element material block having a second surface at a second height different than the first height, the second phantom element material block at least partially including a second material having a second attenuation coefficient different than the first attenuation coefficient, wherein the first phantom element material block and said second phantom element material block are co-positioned on a detector.
    Type: Application
    Filed: October 12, 2001
    Publication date: April 17, 2003
    Inventors: John Patrick Kaufhold, John Eric Tkaczyk, Dinko E. Gonzalez Trotter, Jeffrey Wayne Eberhard, Jerry A. Thomas