Patents by Inventor Jerry B. Schappacher
Jerry B. Schappacher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8786515Abstract: A phased array antenna includes a semiconductor wafer, with radio frequency (RF) circuitry fabricated on top side of the semiconductor wafer. There is an array of antenna elements above the top side of the semiconductor wafer, and a coaxial coupling arrangement coupling the RF circuitry and the array of antenna elements. The coaxial coupling arrangement may include a plurality of coaxial connections, each having an outer conductor, an inner conductor, and a dielectric material therebetween. The dielectric material may be air.Type: GrantFiled: August 30, 2011Date of Patent: July 22, 2014Assignee: Harris CorporationInventors: Louis R. Paradiso, Sean Ortiz, Donald Franklin Hege, James J. Rawnick, Lora A. Theiss, Jerry B. Schappacher
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Publication number: 20130050055Abstract: A phased array antenna includes a semiconductor wafer, with radio frequency (RF) circuitry fabricated on top side of the semiconductor wafer. There is an array of antenna elements above the top side of the semiconductor wafer, and a coaxial coupling arrangement coupling the RF circuitry and the array of antenna elements. The coaxial coupling arrangement may include a plurality of coaxial connections, each having an outer conductor, an inner conductor, and a dielectric material therebetween. The dielectric material may be air.Type: ApplicationFiled: August 30, 2011Publication date: February 28, 2013Applicant: Harris CorporationInventors: Louis R. Paradiso, Sean Ortiz, Donald Franklin Hege, James J. Rawnick, Lora A. Theiss, Jerry B. Schappacher
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Patent number: 7321233Abstract: An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area.Type: GrantFiled: January 11, 2007Date of Patent: January 22, 2008Assignee: Cascade Microtech, Inc.Inventors: Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason
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Patent number: 7164279Abstract: An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area.Type: GrantFiled: December 9, 2005Date of Patent: January 16, 2007Assignee: Cascade Microtech, Inc.Inventors: Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason
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Patent number: 6987398Abstract: An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area.Type: GrantFiled: September 28, 2004Date of Patent: January 17, 2006Assignee: Cascade Microtech, Inc.Inventors: Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason
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Patent number: 6803779Abstract: An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween despite, for example, variable positioning of the device-probing ends of the network on the probing areas. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area.Type: GrantFiled: June 11, 2003Date of Patent: October 12, 2004Assignee: Cascade Microtech, Inc.Inventors: Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason
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Publication number: 20030210033Abstract: An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween despite, for example, variable positioning of the device-probing ends of the network on the probing areas. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area.Type: ApplicationFiled: June 11, 2003Publication date: November 13, 2003Inventors: Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason
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Patent number: 6608496Abstract: An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween despite, for example, variable positioning of the device-probing ends of the network on the probing areas. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area.Type: GrantFiled: July 7, 2000Date of Patent: August 19, 2003Assignee: Cascade Microtech, Inc.Inventors: Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason
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Patent number: 6130544Abstract: An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween despite, for example, variable positioning of the device-probing ends of the network on the probing areas. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area.Type: GrantFiled: July 22, 1999Date of Patent: October 10, 2000Assignee: Cascade Microtech, Inc.Inventors: Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason
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Patent number: 5973505Abstract: An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred there-between despite, for example, variable positioning of the device-probing ends of the network on the probing areas. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area.Type: GrantFiled: October 19, 1998Date of Patent: October 26, 1999Assignee: Cascade Microtech, Inc.Inventors: Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason
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Patent number: 5869975Abstract: An interconnect assembly for evaluating a probe measurement network includes a base, respective first, second and third device-probing areas arranged on an upper face of the base in spaced-apart relation so that first, second and third device-probing ends belonging to the measurement network can be simultaneously placed on these respective areas, a reference junction, and a high frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween despite variable positioning of the device-probing ends on the probing areas. Because the transmission structure uniformly transfers signals despite variable positioning of the device-probing ends, the measurement network can be accurately calibrated with reference, in particular, to the device-probing ends of the network by a reference unit connected to the reference junction.Type: GrantFiled: May 30, 1997Date of Patent: February 9, 1999Assignee: Cascade Microtech, Inc.Inventors: Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason
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Patent number: 5659255Abstract: A method of evaluating the signal conditions in a probe measurement network of the type having a plurality of separate measurement channels, where each channel communicates through a corresponding device-probing end. The method includes providing an assembly which includes a conductive planar probing area on the upper face of a base and a reference junction connected to the probing area by a high-frequency transmission structure. The method further includes placing the respective device-probing end of a first one of the measurement channels into contact with the planar probing area, transmitting a high-frequency signal through both the measurement channel and the reference junction and, thereafter, measuring the signal.Type: GrantFiled: June 26, 1996Date of Patent: August 19, 1997Assignee: Cascade Microtech, Inc.Inventors: Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason
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Patent number: 5561377Abstract: An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween despite, for example, variable positioning of the device-probing ends of the network on the probing areas. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area.Type: GrantFiled: April 14, 1995Date of Patent: October 1, 1996Assignee: Cascade Microtech, Inc.Inventors: Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason