Patents by Inventor Jerry D. Merryman

Jerry D. Merryman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5592211
    Abstract: A laser pattern inspection and/or writing system which writes or inspects a pattern on a target on a stage, by raster scanning the target pixels. Inspection can also be done by substage illumination with non-laser light. A database, organized into frames and strips, represents an ideal pattern as one or more polygons. Each polygon's data description is contained within a single data frame. The database is transformed into a turnpoint polygon representation, then a left and right vector representation, then an addressed pixel representation, then a bit-mapped representation of the entire target. Most of the transformations are carried out in parallel pipelines. Guardbands around polygon sides are used for error filtering during inspection. Guardbands are polygons, and frames containing only guardband information are sent down dedicated pipelines. Error filtering also is done at the time of pixel comparisons of ideal with real patterns, and subsequently during defect area consolidation.
    Type: Grant
    Filed: February 28, 1995
    Date of Patent: January 7, 1997
    Assignee: Texas Instruments Incorporated
    Inventors: Vernon R. Porter, William G. Manns, Anthony B. Wood, Jerry D. Merryman, Don J. Weeks, S. Charles Baber, Thomas C. Penn
  • Patent number: 5322999
    Abstract: A method and apparatus for precise control of a galvanometer patterning system is provided in which a patterning beam (12) is deflected off of a galvanometer mirror (14) toward a work piece (10). The position of the galvanometer mirror (14) is determined by generating a measurement beam (20), transmitting it through a cylinder lens (26) and deflecting it off of the galvanometer mirror (14). The deflected measurement beam (20) is filtered through grating filter (28) having two side-by-side gratings. Light passing through the side-by-side gratings filter (28) is focused on a detector (36) through an anamorphic condenser (32 and 34).
    Type: Grant
    Filed: October 13, 1992
    Date of Patent: June 21, 1994
    Inventors: Jerry D. Merryman, S. Charles Baber
  • Patent number: 5027132
    Abstract: A laser pattern inspection and/or writing system which writes or inspects a pattern on a target on a stage, by raster scanning the target pixels. Inspection can also be done by substage illumination with non-laser light. A database, organized into frames and strips, represents an ideal pattern as one or more polygons. Each polygon's data decription is contained within a single data frame. The database is transformed into a turnpoint polygon representation, then a left and right vector representation, then an addressed pixel representation, then a bit-mapped representation of the entire target. Most of the transformations are carried out in parallel pipelines. Guardbands around polygon sides are used for error filtering during inspection. Guardbands are polygons, and frames containing only guardband information are sent down dedicated pipelines. Error filtering also is done at the time of pixel comparisons of ideal with real patterns, and subsequently during defect area consolidation.
    Type: Grant
    Filed: August 31, 1989
    Date of Patent: June 25, 1991
    Assignee: Texas Instruments Incorporated
    Inventors: William G. Manns, Don J. Weeks, Jerry D. Merryman, Chyi N. Sheng
  • Patent number: 5018210
    Abstract: A laser pattern inspection and/or writing system which writes or inspects a pattern on a target on a stage, by raster scanning the target pixels. Inspection can also be done by substage illumination with non-laser light. A database, organized into frames and strips, represents an ideal pattern as one or more polygons. Each polygon's data description is contained within a single data frame. The database is transformed into a turnpoint polygon representation, then a left and right vector representation, then an addressed pixel representation, then a bit-mapped representation of the entire target. Most of the transformations are carried out in parallel pipelines. Guardbands around polygon sides are used for error filtering during inspection. Guardbands are polygons, and frames containing only guardband information are sent down dedicated pipelines. Error filtering also is done at the time of pixel comparisons of ideal with real patterns, and subsequently during defect area consolidation.
    Type: Grant
    Filed: March 25, 1988
    Date of Patent: May 21, 1991
    Assignee: Texas Instruments Incorporated
    Inventors: Jerry D. Merryman, Thomas C. Penn, William G. Manns, Don J. Weeks, Anthony B. Wood
  • Patent number: 4886958
    Abstract: A laser pattern inspection and/or writing system which writes or inspects a pattern on a target on a stage, by raster scanning the target pixels. An autofocus keeps the scanning laser beam in focus on the target. The autofocus system includes an objective lens assembly through which a first laser beam is directed onto a writing surface, an autofocus laser which is detected by a photodetector after it is reflected from the surface of a target, and a linear magnetic motor for moving a lens in the objective lens assembly to keep the first laser beam focused on the writing surface.
    Type: Grant
    Filed: March 25, 1988
    Date of Patent: December 12, 1989
    Assignee: Texas Instruments Incorporated
    Inventors: Jerry D. Merryman, Vernon R. Porter
  • Patent number: 4145656
    Abstract: A transceiver receives electronic input signals comprised of a plurality of frequency bands lying within a plurality of non-overlapping frequency channels. A mixer frequency shifts a selected band to a predetermined center frequency in response to a first clocking signal of a first selectable frequency. A charge transfer device filter is coupled to the mixer output to filter the band of the predetermined center frequency in response to a second selectable frequency clocking signal. The clocking signals are generated by clocking means which receive digital microcommands identifying the selectable frequencies. Signal level measuring means are coupled to the output of the charge transfer device filter and generate digital level signals indicating the signal level present in the filtered band. Microprocessor means are coupled to send microcommands to the clocking means for sequentially filtering various channels from the plurality, and for monitoring the resulting digital level signals.
    Type: Grant
    Filed: April 27, 1977
    Date of Patent: March 20, 1979
    Assignee: Texas Instruments Incorporated
    Inventors: Jerry D. Merryman, Michael J. Cochran, Edward R. Caudel