Patents by Inventor Jerry E. Cahill
Jerry E. Cahill has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7251085Abstract: An optical resonance analysis system comprising a sensor means (60) and an illumination means (400) for generating non-monochromatic illumination. The illumination means (400) further comprises a means for generating illumination at a plurality of angles, a lens system for projecting said illumination at said plurality of angles (390) and a dispersive device (380) for dispersing said illumination at each of said plurality of angles so that there is a correlation between said plurality of angles and the wavelengths of said illumination such that a resonance condition is generated on said sensor mean (60) for all wavelengths generated by said non-monochromatic source simultaneously. The analysis system also comprises a detection means (90) for detecting the reflected or transmitted illumination. Another embodiment comprises an anamorphic imaging means (120).Type: GrantFiled: July 28, 2006Date of Patent: July 31, 2007Assignee: Applera CorporationInventors: Dar Bahatt, Jerry E. Cahill, Koichi Nishikida, Enrico G. Picozza, Paul G. Saviano, David H. Tracy, Yongdong Wang
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Patent number: 6873417Abstract: An optical resonance analysis system comprising a sensor means (60) and an illumination means (400) for generating non-monochromatic illumination. The illumination means (400) further comprises a means for generating illumination at a plurality of angles, a lens system for projecting said illumination at said plurality of angles (390) and a dispersive device (380) for dispersing said illumination at each of said plurality of angles so that there is a correlation between said plurality of angles and the wavelengths of said illumination such that a resonance condition is generated on said sensor mean (60) for all wavelengths generated by said non-monochromatic source simultaneously. The analysis system also comprises a detection means (90) for detecting the reflected or transmitted illumination. Another embodiment comprises an anamorphic imaging means (120).Type: GrantFiled: April 28, 2003Date of Patent: March 29, 2005Assignee: Applera CorporationInventors: Dar Bahatt, Jerry E. Cahill, Koichi Nishikida, Enrico G. Picozza, Paul G. Saviano, David H. Tracy, Yongdong Wang
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Publication number: 20030210399Abstract: An optical resonance analysis system comprising a sensor means (60) and an illumination means (400) for generating non-monochromatic illumination. The illumination means (400) further comprises a means for generating illumination at a plurality of angles, a lens system for projecting said illumination at said plurality of angles (390) and a dispersive device (380) for dispersing said illumination at each of said plurality of angles so that there is a correlation between said plurality of angles and the wavelengths of said illumination such that a resonance condition is generated on said sensor mean (60) for all wavelengths generated by said non-monochromatic source simultaneously. The analysis system also comprises a detection means (90) for detecting the reflected or transmitted illumination. Another embodiment comprises an anamorphic imaging means (120).Type: ApplicationFiled: April 28, 2003Publication date: November 13, 2003Applicant: Applera CorporationInventors: Dar Bahatt, Jerry E. Cahill, Koichi Nishikida, Enrico G. Picozza, Paul G. Saviano, David H. Tracy, Yongdong Wang
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Patent number: 6600563Abstract: An optical resonance analysis system comprising a sensor means (60) and an illumination means (400) for generating non-monochromatic illumination. The illumination means (400) further comprises a means for generating illumination at a plurality of angles, a lens system for projecting said illumination at said plurality of angles (390) and a dispersive device (380) for dispersing said illumination at each of said plurality of angles so that there is a correlation between said plurality of angles and the wavelengths of said illumination such that a resonance condition is generated on said sensor mean (60) for all wavelengths generated by said non-monochromatic source simultaneously. The analysis system also comprises a detection means (90) for detecting the reflected or transmitted illumination. Another embodiment comprises an anamorphic imaging means (120).Type: GrantFiled: July 17, 2000Date of Patent: July 29, 2003Assignee: Applera CorporationInventors: Dar Bahatt, Jerry E. Cahill, Koichi Nishikida, Enrico G. Picozza, Paul G. Saviano, David H. Tracy, Yongdong Wang
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Patent number: 6049762Abstract: Standardization is achieved for FTIR spectrometric instruments that effect an intrinsic distortion in spectral information, the distortion being associated with an aperture size. An idealized function of spectral line shape is specified. With a small calibration aperture, spectral data is obtained for a basic sample having known "true" spectral data, and standard spectral data also is obtained for a standard sample. With a larger, normal sized aperture, standard spectral data is obtained again for the calibration sample. A transformation factor, that is a function of this data and the standardized function, is applied to spectral data for test samples to effect standardized information. In another embodiment, the standard sample has known true spectral data, and the basic sample is omitted. In either case, the transformation factor is applied to the sample data in logarithm form, the antilogarithm of the result effects the standardized information.Type: GrantFiled: December 18, 1997Date of Patent: April 11, 2000Assignee: Perkin Elmer LLCInventors: Alan M. Ganz, Yongdong Wang, David H. Tracy, Robert A. Hoult, Jerry E. Cahill, David A. Huppler
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Patent number: 5958246Abstract: A primary chromatographic system is operated with a standard sample at several temperatures to generate primary retention times which are fitted to a function to determine thermodynamic constants to relate the times to temperature. A target chromatographic system is operated with the standard sample to generate secondary retention times. The function is used with these times to determine and an effective column parameter for the target system. The function then is used with this parameter and the primary times to determine a pressure program. Further operation of the target system with a application sample and the pressure program effects standardized retention times. A particular searching technique is utilized to apply the function. A temperature calibration technique with a selected sample measures column temperature for the target system, and a validation is done on the target system.Type: GrantFiled: May 14, 1998Date of Patent: September 28, 1999Assignee: The Perkin-Elmer CorporationInventors: Andrew Tipler, Adam J. Patkin, Andrew P. Bajorinas, Jerry E. Cahill, Ralph L. Carter
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Patent number: 5915269Abstract: In a gas chromatograph system having a column with a stationary phase and a carrier gas moving through the column to contact the stationary phase, the system being useful for detecting analytes in a sample, a method and apparatus for predicting the retention times for the analytes under various conditions, the method utilizing the steps of:a) detecting the analytes under a number of sets of given conditions;b) calculating values for various parameters characteristic of the system based on a mathematical model that includes a correction to compensate for the permeability of said column to said carrier gas;c) entering into the model the values for the characteristic parameters and at least one further set of conditions; andd) using the model to predict retention times for conditions other than those of step a;the apparatus composed of a data handling system including a model for predicting retention times at a variety of conditions of operation of the system, the model having a first set of inputs including retType: GrantFiled: April 14, 1998Date of Patent: June 22, 1999Assignee: The Perkin-Elmer CorporationInventors: Jerry E. Cahill, David H. Tracy
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Patent number: 5526451Abstract: In a spectrophotometer, each of a plurality of source optical fibers is selectively receptive of source radiation and carries the radiation to a corresponding selected liquid sample cell. A corresponding return optical fiber returns transmitted radiation from the sample to a polychromator. For selecting a sample, a switching member holds exposed ends of the optical fibers on a circle coaxial with an axle for rotating to selected positions. Respective optical trains in the instrument direct radiation into and out of the selected pair of fibers. The diameter of a source aperture, the spacing of the aperture from the radiation source, and the source area define a source etendue. The optical fibers have a fiber etendue substantially the same as the source etendue.Type: GrantFiled: October 18, 1994Date of Patent: June 11, 1996Assignee: The Perkin-Elmer CorporationInventors: Jerry E. Cahill, David H. Tracy
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Patent number: 5481631Abstract: An optical switch includes a primary optical fiber terminating in a primary window, and a plurality of secondary optical fibers each terminating in a secondary window facing in the same direction as and spaced laterally from the primary window. A primary lens on a primary axis has a focal point positioned on the axis at the central window. Each of a plurality of secondary lenses has an axis and a focal point positioned on such axis at a secondary window. The secondary axes are parallel to and equidistant from the primary axis. A retroreflector is spaced from the lenses oppositely from each window and has an optical axis centered parallel to the primary axis midway between the primary axis and any of the secondary fibers. A stepper motor rotates the retroreflector about the primary axis to each of a plurality of selected positions to provide optical switching for light transmission between the primary fiber and any selected secondary fiber.Type: GrantFiled: February 25, 1994Date of Patent: January 2, 1996Assignee: The Perkin-Elmer Corp.Inventors: Jerry E. Cahill, David H. Tracy
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Patent number: 5428558Abstract: A method and apparatus are provided for correction of spectra for stray radiation in a spectrometric instrument, involving a sequence of steps as follows. Spectral patterns are obtained with the instrument initially for monochromatic radiation at a plurality of selected calibration wavelengths. By computer program, the peak profile at the calibration wavelength in each pattern is replaced with a substitute based on the remaining pattern. The resulting data are interpolated to effect values denoted "stray proportions" for the ordered wavelengths of the instrument. Spectral data at each ordered wavelength are obtained with the instrument for a sample, and multiplied in the computer program by stray proportions for corresponding wavelengths to effect further sets of values denoted "stray portions" that are identified to the ordered wavelengths. Each set is identified to one of the wavelength increments of the instrument across the spectral range.Type: GrantFiled: December 17, 1993Date of Patent: June 27, 1995Assignee: The Perkin-Elmer CorporationInventors: Jerry E. Cahill, Alan M. Ganz, Paul Saviano, David Tracy, Yongdong Wang
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Patent number: 5428696Abstract: In a spectrophotometer, each of a plurality of source optical fibers is selectively receptive of source radiation and carries the radiation to a corresponding selected liquid sample cell. A corresponding return optical fiber returns transmitted radiation from the sample to a polychromator. For selecting a sample, a switching member holds exposed ends of the optical fibers on a circle coaxial with an axle for rotating to selected positions. Respective optical trains in the instrument direct radiation into and out of the selected pair of fibers. The diameter of a source aperture, the spacing of the aperture from the radiation source, and the source area define a source etendue. The optical fibers have a fiber etendue substantially the same as the source etendue.Type: GrantFiled: July 15, 1993Date of Patent: June 27, 1995Assignee: The Perkin-Elmer CorporationInventors: Jerry E. Cahill, David H. Tracy
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Patent number: 4692883Abstract: This invention is directed to a digital wavelength calibration system for a spectrophotometer, which includes a photodiode array that forms an output detector for the spectrophotometer, a light source for generating at least one reference emission line of known peak wavelength, a computer controlled mechanism for causing the peak of said reference line to fall in close proximity to the center of a preselected pixel of said photodiode array, peak location computing apparatus for computing the exact position data of the peak relative to the pixel center in terms of the pixel spacing and the ordinal number of the preselected pixel and for retaining this position data for subsequent wavelength computation, wavelength identification computing apparatus for computing the numerical relationship data of the ordinate number of each pixel to the wavelength falling on that pixel and for retaining this relationship data for subsequent correlation with data generated by the pixel, and apparatus for computational processinType: GrantFiled: February 21, 1985Date of Patent: September 8, 1987Assignee: The Perkin-Elmer CorporationInventors: Michael R. Nelson, Roy E. Boostrom, Jerry E. Cahill, Tzong Hwang
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Patent number: 4669880Abstract: Output data from a spectrophotometer may be presented as a series of data values representative of the intensity amplitude of pass bands having equal bandwidths (resolution) and spaced at wavelength intervals equal to the bandwidth. For some purposes it is desirable to increase the bandwidth of said data, and this invention discloses method and apparatus for converting such data to equivalent data having a selected greater bandwidth.Type: GrantFiled: February 21, 1985Date of Patent: June 2, 1987Assignee: The Perkin-Elmer CorporationInventors: Michael R. Nelson, Jerry E. Cahill