Abstract: A cell bypass circuit is disclosed which includes a diode 32 connected electrically in parallel with a cell 20 of a battery 12. A thermal switch 34 is mounted in thermal contact with a diode 32. A relay 38 including a coil 36 and a contact 40 is provided. The coil 36 is connected to the thermal switch 34 so as to be activated by the activation thereof. The contact 40 of the relay 38 is connected in parallel with the cell 20 so that the activation of the diode 32 causes thermal energy to radiate therefrom activating the thermal switch 34. The activation of the thermal switch 34 causes the activation of the relay 38 which in turn places an electrical short across the defective cell 20 via the contacts 40 thereof.

Abstract: The present invention generally provides a thermally-activated, shorting-diode switch whose composite diode structure possesses a non-operationally-alterable junction path, and whose diode shorting is effectuated by temperature-sensitive companion elements. The diode structure includes a semiconductor diode element to which associated first and second lead substructures are both unalterably connected. When activated by the increased temperatures experienced by the diode structure upon conduction, the shorting elements establish a direct, diode-bypass connection between the lead substructures.In a first more-specific embodiment, the shorting mechanism encompasses a solder preform which melts and flows over the diode structure when conduction-interval temperatures are generated.

Abstract: An electromagnetically controlled, temperature-sensitive (ECTS) reed switch comprising a temperature-sensitive reed switch with an electromagnetic coil spirally wound around the exterior thereof for initiating a switching action of the reed switch independently of the ambient temperature of the switch.

Abstract: A temperature-responsive circuit comprising an ECTS reed switch and an interrogation means for determining the operability and accuracy of the temperature-responsive portion of the circuit.