Abstract: The synchronous logic device with reduced pin count scan chain includes: more than two flip/flops coupled to form a shift register for receiving a scan data input signal; a combinational logic circuit for receiving device inputs, generating flip/flop inputs for the more than two flip/flops, and generating an output signal; a first multiplexer for providing a clock signal to the more than two flip/flops during a test mode; a second multiplexer for selecting between a test mode output from the shift register and the output signal from the combinational logic circuit, and for providing a scan data output signal; and wherein the scan data input signal and the scan data output signal share an input/output pin.

Abstract: A digital to analog converter includes a coarse resolution resistor circuit (11) coupled between a first voltage (Vin) and an intermediate voltage (V0) to produce coarse resolution node voltages (V0, . . . V240), and also includes a fine resolution resistor circuit (20) coupled between the intermediate voltage and a second voltage (GND). One of the coarse resolution node voltages is selected in response to a group of MSB bits of a digital input (D0,1 . . . ) to produce a first output voltage (Vout2), and one of the fine resolution node voltages is selected in response to group of LSB bits of the digital input to produce a second output voltage (Vout1), the second output voltage (Vout1) and the first output voltage (Vout2) providing a differential analog output signal (Vout1?Vout2). In one embodiment, the coarse resolution and fine resolution resistor circuits are string resistor circuits, and in another embodiment they are modified R-2R networks.

Abstract: An operational amplifier having an adjustable input offset is provided that can improve dynamic performance by allowing processing of the input signal in continuous-time. The amplifier circuit comprises an input source and an operational amplifier configured with an adjustable input offset circuit. The adjustable input offset circuit enables cancellation of the offset error from any input sources prior to being translated or gained up by the operational amplifier, thus improving the dynamic range of the operational amplifier. The adjustable input offset circuit can be configured within a signal path of an auto-zero loop of the operational amplifier, or with a continuous-time implementation.

Abstract: An operational amplifier having an adjustable input offset is provided that can improve dynamic performance by allowing processing of the input signal in continuous-time. The amplifier circuit comprises an input source and an operational amplifier configured with an adjustable input offset circuit. The adjustable input offset circuit enables cancellation of the offset error from any input sources prior to being translated or gained up by the operational amplifier, thus improving the dynamic range of the operational amplifier. The adjustable input offset circuit can be configured within a signal path of an auto-zero loop of the operational amplifier, or with a continuous-time implementation.

Abstract: A base current compensation circuit is configured for injecting base current to the base of a transistor device to compensate for the lost current demanded by a transistor base. The base current compensation circuit is configured to inject current into the base of the transistor without the headroom requirements, as well as being less complex than other approaches. An exemplary base current compensation circuit comprises a sampling circuit and a current mirror feedback circuit configured for providing multiples of the base current demanded by the transistor device.

Abstract: A leakage compensation circuit and technique is provided that compensates for losses in a referenced current of an amplifier circuit due to leakage elements. The leakage compensation circuit is configured to inject current substantially equal in magnitude to the leakage current into one or more junctions of the amplifier circuit to compensate for lost referenced current due to leakage. As a result, the amplifier circuit and various devices can realize the flow of the reference current as substantially intended without detrimental effects of leakage current, thus maintaining the integrity of the referenced current. The leakage compensation circuit comprises an array of compensation regions configured to approximate the collective loss that is created by the leakage elements and provide a compensation current substantially equal in magnitude to one or more junctions to compensate for lost referenced current.

Abstract: A base current compensation circuit is configured for injecting base current to the base of a transistor device to compensate for the lost current demanded by a transistor base. The base current compensation circuit is configured to inject current into the base of the transistor without the headroom requirements, as well as being less complex than other approaches. An exemplary base current compensation circuit comprises a sampling circuit and a current mirror feedback circuit configured for providing multiples of the base current demanded by the transistor device.

Abstract: A leakage compensation circuit and technique is provided that compensates for losses in a referenced current of an amplifier circuit due to leakage elements. The leakage compensation circuit is configured to inject current substantially equal in magnitude to the leakage current into one or more junctions of the amplifier circuit to compensate for lost referenced current due to leakage. As a result, the amplifier circuit and various devices can realize the flow of the reference current as substantially intended without detrimental effects of leakage current, thus maintaining the integrity of the referenced current. The leakage compensation circuit comprises an array of compensation regions configured to approximate the collective loss that is created by the leakage elements and provide a compensation current substantially equal in magnitude to one or more junctions to compensate for lost referenced current.

Abstract: A temperature curvature compensation technique and circuit can be realized through the generation of a temperature curvature compensation voltage provided by measuring the difference between the base-emitter voltage Vbe of two different transistors operating at two different temperature coefficient quiescent currents. This voltage difference measured between two such transistors results in a scaled voltage that is representative of the temperature curvature of the base-emitter voltage Vbe of a transistor, and which can then be summed to the bandgap reference output to provide a temperature compensated, bandgap reference voltage. The above method can be carried out in an amplifier circuit configured to receive and sum the temperature curvature compensation voltage and the bandgap reference output voltage into the temperature compensated, bandgap reference voltage.

Abstract: Curvature in a reference voltage produced by a switched capacitor band gap reference circuit is compensated by producing a first .DELTA.V.sub.BE voltage by causing first and second PTAT/R currents to flow through a first .DELTA.V.sub.BE -generating circuit. The first .DELTA.V.sub.BE voltage is applied to a first terminal of a first capacitor having a second terminal coupled to a summing conductor of an operational amplifier producing the reference voltage. A second .DELTA.V.sub.BE voltage is produced by causing a third PTAT/R current and a fourth current to flow through a second .DELTA.V.sub.BE -generating circuit. The second .DELTA.V.sub.BE voltage is applied to a first terminal or a second capacitor having a second terminal coupled to the summing conductor.