Abstract: Embodiments of the present invention provide testing systems that perform advanced system level testing of multiple devices in parallel over a network connection that provides access to multiple development stations for improved efficiency and access to system level testing. A rack integrated computer (RIC) is coupled to multiple tester racks of single board computers (SBCs) and provides access to the SBCs as development workstations for use over a computer network (e.g., a customer network). SBCs can provide end level testing of devices like smartphones that include several different devices (DUTs). Access to the SBCs as development workstations can be enforced on an IP level under a development license, and the license may be used from any global location using a static IP address and/or virtual private network, for example.