Patents by Inventor Jesse D. Olson

Jesse D. Olson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8153968
    Abstract: A laser atom probe situates a counter electrode between a specimen mount and a detector, and provides a laser having its beam aligned to illuminate the specimen through the aperture of the counter electrode. The detector, specimen mount, and/or the counter electrode may be charged to some boost voltage and then be pulsed to bring the specimen to ionization. The timing of the laser pulses may be used to determine ion departure and arrival times allowing determination of the mass-to-charge ratios of the ions, thus their identities. Automated alignment methods are described wherein the laser is automatically directed to areas of interest.
    Type: Grant
    Filed: January 22, 2010
    Date of Patent: April 10, 2012
    Assignee: Cameca Instruments, Inc.
    Inventors: Joseph Hale Bunton, Jesse D. Olson, Daniel R. Lenz
  • Publication number: 20100282964
    Abstract: A method for aligning an energy beam to an object in an atom probe is disclosed. The method comprises monitoring at least one parameter indicative of an interaction between the energy beam and the object. A signal is generated in response to the interaction of the energy beam and the object. The signal is then used to effectuate control of the alignment of the energy beam to the object.
    Type: Application
    Filed: August 27, 2008
    Publication date: November 11, 2010
    Inventors: Joseph Hale Bunton, Jesse D. Olson, Roger Alvis, Daniel R. Lenz, Ed Oltman
  • Patent number: 7772552
    Abstract: In an atom probe or other mass spectrometer wherein a specimen is subjected to ionizing pulses (voltage pulses, thermal pulses, etc.) which induce field evaporation of ions from the specimen, the evaporated ions are then subjected to corrective pulses which are synchronized with the ionizing pulses. These corrective pulses have a magnitude and timing sufficient to reduce the velocity distribution of the evaporated ions, thereby resulting in increased mass resolution for the atom probe/mass spectrometer. In a preferred arrangement, ionizing pulses are supplied to the specimen from a first counter electrode adjacent the specimen. The corrective pulses are then supplied from a second counter electrode which is coupled to the first via a passive or active network, with the network controlling the form (timing, amplitude, and shape) of the corrective pulses.
    Type: Grant
    Filed: June 17, 2005
    Date of Patent: August 10, 2010
    Assignee: Cameca Instruments, Inc.
    Inventors: Tye Gribb, Jesse D. Olson, Daniel Lenz, Joseph H. Bunton
  • Publication number: 20100116985
    Abstract: A laser atom probe situates a counter electrode between a specimen mount and a detector, and provides a laser having its beam aligned to illuminate the specimen through the aperture of the counter electrode. The detector, specimen mount, and/or the counter electrode may be charged to some boost voltage and then be pulsed to bring the specimen to ionization. The timing of the laser pulses may be used to determine ion departure and arrival times allowing determination of the mass-to-charge ratios of the ions, thus their identities. Automated alignment methods are described wherein the laser is automatically directed to areas of interest.
    Type: Application
    Filed: January 22, 2010
    Publication date: May 13, 2010
    Applicant: Imago Scientific Instruments Corporation
    Inventors: Joseph H. Bunton, Jesse D. Olson
  • Patent number: 7652269
    Abstract: A laser atom probe (100) situates a counter electrode between a specimen mount and a detector (106), and provides a laser (116) having its beam (122) aligned to illuminate the specimen (104) through the aperture (110) of the counter electrode (108). The detector, specimen mount (102), and/or the counter electrode may be charged to some boost voltage and then be pulsed to bring the specimen to ionization. The timing of the laser pulses may be used to determine ion departure and arrival times allowing determination of the mass-to-charge ratios of the ions, thus their identities. Automated alignment methods are described wherein the laser is automatically directed to areas of interest.
    Type: Grant
    Filed: August 19, 2004
    Date of Patent: January 26, 2010
    Assignee: Imago Scientific Instruments Corporation
    Inventors: Joseph Hale Bunton, Jesse D. Olson
  • Publication number: 20090050797
    Abstract: In an atom probe or other mass spectrometer wherein a specimen is subjected to ionizing pulses (voltage pulses, thermal pulses, etc.) which induce field evaporation of ions from the specimen, the evaporated ions are then subjected to corrective pulses which are synchronized with the ionizing pulses. These corrective pulses have a magnitude and timing sufficient to reduce the velocity distribution of the evaporated ions, thereby resulting in increased mass resolution for the atom probe/mass spectrometer. In a preferred arrangement, ionizing pulses are supplied to the specimen from a first counter electrode adjacent the specimen. The corrective pulses are then supplied from a second counter electrode which is coupled to the first via a passive or active network, with the network controlling the form (timing, amplitude, and shape) of the corrective pulses.
    Type: Application
    Filed: June 17, 2005
    Publication date: February 26, 2009
    Applicant: Imago Scientific Instruments Corporation
    Inventors: Tye Gribb, Jesse D. Olson, Daniel R. Lenz, Joseph H. Bunton
  • Publication number: 20080296489
    Abstract: The present invention relates to atom probe evaporation processes. For example, certain aspects are directed toward methods for controlling an evaporation process in an atom probe that includes initiating the atom probe evaporation process and monitoring a parameter associated with material being evaporated from a specimen. The method can further include controlling at least one characteristic of the atom probe evaporation process to attain a desired evaporation rate or characteristic. In selected embodiments, monitoring a parameter associated with material being evaporated can include monitoring an evaporation rate, mass-to-charge ratios of evaporated ions, a mass resolution, a composition of material being evaporated, and/or the like. In certain embodiments, controlling at least one characteristic can include controlling a pulse energy, a pulse frequency, a bias energy, and/or the like. In other embodiments, various portions of the above process can be computer implemented.
    Type: Application
    Filed: July 28, 2006
    Publication date: December 4, 2008
    Inventors: Jesse D. Olson, Daniel R. Lenz, Timothy R. Payne