Patents by Inventor Jesse R. Boyer

Jesse R. Boyer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20090299690
    Abstract: A method for measuring dimensions between selected points on a side of interest in objects selected for measurement by an optical measuring system comprising a flatbed scanner and a connected computer system through acquiring a reference image to provide corresponding image distance errors; and also acquiring a measurement object image. Deviation curves are provided as the basis for determining deviation errors in the measurement object image. Corrected measurement object image distances are formed through combining the deviation errors in the measurement object image distances with the corresponding measurement object image. These corrected measurement object image distances are used to determine distances between chosen pairs of those selected locations.
    Type: Application
    Filed: May 29, 2008
    Publication date: December 3, 2009
    Applicant: United Technologies Corporation
    Inventors: Randall W. Joyner, Jesse R. Boyer
  • Patent number: 7578178
    Abstract: A method of inspecting an internal feature of a gas turbine component includes removing a portion of the turbine component to expose the internal feature, treating the surfaces of the internal feature to provide the surfaces with a substantially uniform coloration, generating an electronic model of the internal feature, analyzing the electronic model generated with reference to a nominal electronic model, and providing an output based on the analysis of the electronic model generated.
    Type: Grant
    Filed: September 28, 2007
    Date of Patent: August 25, 2009
    Assignee: United Technologies Corporation
    Inventors: Jesse R. Boyer, Benjamin W. Meissner, Stephen D. Doll, Randall W. Joyner
  • Patent number: 7573586
    Abstract: A method of measuring a coating thickness involves projecting a pattern of light on a surface. A first reflection of the pattern of light is received by a first image capturing device. A second reflection of the pattern of light is received by an image capturing device which may be the same or a different image capturing device. The first reflection is compared with the second reflection. A first dated map of the surface is created by comparing the first reflection and the second reflection. A coating is deposited on the surface. A second data map of the surface with the coating is created by comparing reflections. The first data map and the second data map are then compared to determine a thickness of the coating.
    Type: Grant
    Filed: June 2, 2008
    Date of Patent: August 11, 2009
    Assignee: United Technologies Corporation
    Inventors: Jesse R. Boyer, Gene P. Allocca, Randall W. Joyner, Jeffrey K. Pearson
  • Publication number: 20090161122
    Abstract: A method for evaluating three-dimensional (3-D) coordinate system measurement accuracy of an optical 3-D measuring system using targeted artifacts is provided. In this regard, an exemplary embodiment of a method for evaluating 3-D coordinate system measurement accuracy using targeted artifacts comprises: taking a series of measurements from different positions and orientations using target dots on a targeted artifact with an optical 3-D measuring system; and calculating measurement errors using the series of measurements. An exemplary embodiment of a targeted artifact used with the method includes a base and target dots located on the base.
    Type: Application
    Filed: December 21, 2007
    Publication date: June 25, 2009
    Applicant: UNITED TECHNOLOGIES CORP.
    Inventors: Jesse R. Boyer, Jeffry K. Pearson, Randall W. Joyner, Joseph D. Drescher
  • Publication number: 20090163390
    Abstract: Artifacts, methods of creating such artifacts and methods of using such artifacts are provided. In this regard, an exemplary embodiment of a method for creating an artifact for quantifying measurement accuracy of non-contact sensors included in optical three-dimensional (3-D) measuring systems, comprises: fabricating an artifact using a base material; and coating the artifact with an approximately uniform coating of dry film lubricant.
    Type: Application
    Filed: December 21, 2007
    Publication date: June 25, 2009
    Applicant: UNITED TECHNOLOGIES CORP.
    Inventors: Jesse R. Boyer, Jeffry K. Pearson, Randall W. Joyner
  • Publication number: 20090089020
    Abstract: A method of inspecting an internal feature of a gas turbine component includes removing a portion of the turbine component to expose the internal feature, treating the surfaces of the internal feature to provide the surfaces with a substantially uniform coloration, generating an electronic model of the internal feature, analyzing the electronic model generated with reference to a nominal electronic model, and providing an output based on the analysis of the electronic model generated.
    Type: Application
    Filed: September 28, 2007
    Publication date: April 2, 2009
    Applicant: United Technologies Corporation
    Inventors: Jesse R. Boyer, Benjamin W. Meissner, Stephen D. Doll, Randall W. Joyner
  • Publication number: 20090033947
    Abstract: A method for inspecting geometrical shapes of objects to determine selected dimensions thereof based on data characterizing such objects obtained through stereoscopic photographs taken by a pair of cameras with fields of view intersecting to thereby provide a photographic event measurement volume that includes at least a portion of each of such objects being photographed. The method involves using previously specified procedures to check on the cameras performance consistency in photographing from different positions, preparing the object to be inspected including providing reference point targets thereon, scanning that object with the cameras from different camera pair positions, processing the resulting data to represent the scan basis geometrical shape of the object, and orient it to compare with the dimensional specifications therefor.
    Type: Application
    Filed: July 31, 2007
    Publication date: February 5, 2009
    Applicant: United Technologies Corporation
    Inventors: Jesse R. Boyer, Jeffry Pearson, Benjamin W. Meissner, Randall W. Joyner, James Romanelli
  • Patent number: 7036236
    Abstract: A method for certifying and calibrating a multi-axis coordinate measuring machine includes the steps of loading a check standard into a means for holding of the multi-axis coordinate measuring machine; measuring a virtual location of each of a plurality of apertures of the check standard within a virtual coordinate system using a touch probe of the multi-axis coordinate measuring machine; measuring an actual location of each of the apertures and simultaneously verifying the accuracy of the virtual coordinate system of the check standard using an optical probe of the multi-axis coordinate measuring machine; and calculating a deviation between the actual location of each of the apertures and a virtual location of each of the apertures of the virtual coordinate system.
    Type: Grant
    Filed: April 7, 2005
    Date of Patent: May 2, 2006
    Assignee: United Technologies Corporation
    Inventors: Joseph D. Drescher, Jesse R. Boyer
  • Patent number: 7024787
    Abstract: A template for evaluating a part, comprising: a surface having a shape corresponding to the part; and at least one element on the surface corresponding to a desired location of a feature on the part. A method of evaluating a part, comprising the steps of: providing a template having a shape corresponding to the part and at least one element thereon corresponding to a desired location on the part; associating the template with the part; and using the element to determine whether the feature is at the desired location.
    Type: Grant
    Filed: July 23, 2004
    Date of Patent: April 11, 2006
    Assignee: United Technologies Corporation
    Inventors: Richard W. Varsell, Jesse R. Boyer, Dorel M. Moisei, James M. Koonankeil, Lukas A. Rubino