Abstract: Apparatus and methods for testing electronic devices. In some embodiments, a fixture for testing an electronic device can include a support frame including a base and a pair of side supports implemented on respective sides of the base, with at least one of the side supports including a plurality of features for mounting of a test hardware, and the base being configured to support a first test board. The fixture can further include an upper support positioned above the support frame and configured to support a second test board. The fixture can further include a suspension mechanism implemented to couple the upper support to the side supports such that the upper support is movable relative to the support frame to accommodate a misalignment between the upper support and the base.

Abstract: Apparatus and methods for testing electronic devices. In some embodiments, a fixture for testing an electronic device can include a support frame including a base and a pair of side supports implemented on respective sides of the base, with at least one of the side supports including a plurality of features for mounting of a test hardware, and the base being configured to support a first test board. The fixture can further include an upper support positioned above the support frame and configured to support a second test board. The fixture can further include a suspension mechanism implemented to couple the upper support to the side supports such that the upper support is movable relative to the support frame to accommodate a misalignment between the upper support and the base.

Abstract: A modular test fixture for testing electronic devices. In some embodiments, such a modular test fixture can include a support frame having a base, and a substrate having a plurality of test components, with the substrate being coupled to the base. The modular test fixture can further include an upper support positioned above the support frame, and a plurality of suspension elements that each extend between the upper support and the support frame. The suspension elements can couple the upper support to the support frame, and the upper support can be movable relative to the support frame. The modular test fixture can further include a daughterboard module coupled to the upper support, and a daughterboard having a test device interface. The daughterboard can be coupled to the daughterboard module and be operatively coupled to the plurality of test components.

Abstract: A modular test fixture for testing electronic devices. In some embodiments, such a modular test fixture can include a support frame having a base, and a substrate having a plurality of test components, with the substrate being coupled to the base. The modular test fixture can further include an upper support positioned above the support frame, and a plurality of suspension elements that each extend between the upper support and the support frame. The suspension elements can couple the upper support to the support frame, and the upper support can be movable relative to the support frame. The modular test fixture can further include a daughterboard module coupled to the upper support, and a daughterboard having a test device interface. The daughterboard can be coupled to the daughterboard module and be operatively coupled to the plurality of test components.