Abstract: In a described example, an apparatus includes: a semiconductor die having a device side surface and an opposing backside surface, the backside surface mounted to a die pad of a lead frame using a die attach film; bond pads overlying the device side surface of the semiconductor die; bond wires electrically coupling the bond pads to leads of the lead frame spaced from the die pad; and mold compound covering the semiconductor die, the bond wires, and portions of the lead frame, where portions of the leads are exposed from the mold compound to form terminals of the packaged semiconductor device. The die attach film has a partially cut die attach film layer with a cut side edge normal to the backside surface, and the die attach film has an uncut die attach film layer with a torn side edge normal to the backside surface.

Abstract: A method includes applying laser pulses along a direction to a side of a wafer to create first and second stealth damage regions at respective first and second depths in the wafer and to create cracks that extend in the wafer from the respective stealth damage regions and that are spaced apart from one another along the direction, applying a compressive and retractive cyclical force to the wafer along the third direction to propagate and join the cracks from the respective stealth damage regions together, and expanding the wafer to separate individual dies from the wafer.

Abstract: Integrated circuit packaging with cavities and methods of manufacturing the same are disclosed. An example apparatus includes a semiconductor die and a housing enclosing portions of the semiconductor die. The housing defines an opening that extends from a surface of the semiconductor die to an external environment, the housing formed of a first material. The example apparatus includes a second material disposed within the opening to block exposure of the semiconductor die to the external environment.

Abstract: Integrated circuit packaging with cavities and methods of manufacturing the same are disclosed. An example apparatus includes a semiconductor die and a housing enclosing portions of the semiconductor die. The housing defines an opening that extends from a surface of the semiconductor die to an external environment, the housing formed of a first material. The example apparatus includes a second material disposed within the opening to block exposure of the semiconductor die to the external environment.

Abstract: A method of making a flip chip assembly includes a substrate having a top surface and forming a plurality of generally longitudinally extending, laterally spaced apart bond fingers are formed on the top surface. Each of the plurality of bond fingers has a first longitudinal end portion and a second longitudinal end portion. Applying a transversely extending solder resist strip over the first longitudinal end portions of the bond fingers. The strip has an edge wall with a plurality of longitudinally projecting tooth portions separated by gaps. Each tooth portion and each gap aligned with a different one of the bond fingers in each adjacent pair of bond fingers.

Abstract: A method of making a flip chip assembly includes a substrate having a top surface and forming a plurality of generally longitudinally extending, laterally spaced apart bond fingers are formed on the top surface. Each of the plurality of bond fingers has a first longitudinal end portion and a second longitudinal end portion. Applying a transversely extending solder resist strip over the first longitudinal end portions of the bond fingers. The strip has an edge wall with a plurality of longitudinally projecting tooth portions separated by gaps. Each tooth portion and each gap aligned with a different one of the bond fingers in each adjacent pair of bond fingers.

Abstract: A flip chip mounting board includes a substrate having a top surface and a plurality of generally parallel, longitudinally extending, laterally spaced apart bond fingers are formed on the top surface. Each of the plurality of bond fingers has a first longitudinal end portion and a second longitudinal end portion. A first strip of laterally extending solder resist material overlies the first longitudinal end portions of the bond fingers. The first strip has an edge wall with a plurality of longitudinally projecting tooth portions separated by gaps with a longitudinally extending tooth portion being aligned with every other one of the bond fingers. Adjacent bond fingers have first end portions covered by different longitudinal lengths of solder resist material.

Abstract: A flip chip mounting board includes a substrate having a top surface and a plurality of generally parallel, longitudinally extending, laterally spaced apart bond fingers are formed on the top surface. Each of the plurality of bond fingers has a first longitudinal end portion and a second longitudinal end portion. A first strip of laterally extending solder resist material overlies the first longitudinal end portions of the bond fingers. The first strip has an edge wall with a plurality of longitudinally projecting tooth portions separated by gaps with a longitudinally extending tooth portion being aligned with every other one of the bond fingers. Adjacent bond fingers have first end portions covered by different longitudinal lengths of solder resist material.

Abstract: Methods of connecting solder bumps located on dies to leads located on substrates are disclosed herein. One embodiment includes applying a first compression force between the solder bump and the lead; relieving the first compression force between the solder bump and the lead; and applying a second compression force between the solder bump and the lead.

Abstract: A mold system for forming a mold cap on a semiconductor component includes a mold base and a mold lid that together define a mold cavity. The mold base supports the semiconductor component within the mold cavity. The semiconductor component defines a component footprint and footprint periphery on the mold base. A supply channel is provided in the mold lid for supplying an encapsulating material to the mold cavity. At least one vent channel is provided in the mold base. The vent channel intersecting the footprint periphery to vent gas trapped between the semiconductor component and the mold base from the mold cavity when the encapsulating material is supplied to the mold cavity.

Abstract: Methods are disclosed for singulating block-molded IC packages. The methods of the invention include steps for making a partial cut in a block-molded semiconductor array, the partial cut defining the perimeter of an IC package and extending partially through the thickness of the array material. In a subsequent step, a final cut is made in alignment with the partial cut at the perimeter of the package such that the package is severed from adjacent material. Various embodiments of the invention are disclosed, including methods for making a plurality of partial cuts prior to making the final cut severing the package from the array, making cuts approaching from the same surface of the array, and making cuts approaching from opposing surfaces of the array. The partial cutting steps are used to prevent array warpage and facilitate hold-down during ball attach and/or singulation processes.