Patents by Inventor Jeung-Dae Kim

Jeung-Dae Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe card for testing semiconductor devices
    Patent number: 6137296
    Abstract: A probe card, used for testing the electric characteristics of semiconductor devices, is disclosed. The probe card has main and subsidiary cards. The main card has a main circuit used for testing the electric characteristics of semiconductor devices. The subsidiary card carries a test tip and is detachably attached to the main card into a module when it is necessary to test the electric characteristics of semiconductor devices. A package card in place of the sub-card may be used with the main card. The package card is used for testing the electric characteristics of semiconductor packages having semiconductor chips tested by the subsidiary card. Therefore, it is possible for the probe card to effectively compare test data of the semiconductor chips of a wafer to test data of finally bonded and molded semiconductor packages having the above chips.
    Type: Grant
    Filed: September 8, 1998
    Date of Patent: October 24, 2000
    Assignee: Samsung Electronics, Co., Ltd.
    Inventors: Jong-Chil Yoon, Jeung-Dae Kim, Young-Syup Kim