Patents by Inventor Jhinhwan LEE

Jhinhwan LEE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10153732
    Abstract: An amplifier circuit and a method of recovering an input signal in the amplifier circuit are provided. The amplifier circuit may recover an input signal by using a time constant and an output signal of a signal amplifier which is delayed by a certain period, based on characteristics of an inverse Laplace transform of a transfer function of the signal amplifier. A time required for recovering the input signal may be shorter than the time constant of the signal amplifier.
    Type: Grant
    Filed: November 30, 2016
    Date of Patent: December 11, 2018
    Assignees: SAMSUNG ELECTRONICS CO., LTD., KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Insu Jeon, Jhinhwan Lee, Hwansoo Suh
  • Patent number: 10126146
    Abstract: A piezoelectric actuator and a method of measuring a motion by using the piezoelectric actuator are provided. The piezoelectric actuator includes: a movable member that is disposed to face the fixed member; a piezoelectric element that is disposed between the fixed member and the movable member, and configured to operate in a shear mode based on input voltages applied to the piezoelectric element and move the movable member relative to the fixed member; and a position sensor that is disposed between the piezoelectric element and the movable member, and configured to measure a motion of the movable member.
    Type: Grant
    Filed: April 27, 2015
    Date of Patent: November 13, 2018
    Assignees: SAMSUNG ELECTRONICS CO., LTD., KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Hwansoo Suh, Insu Jeon, Jhinhwan Lee
  • Patent number: 10113683
    Abstract: A transfer line includes a first conduit, a first insulation part, a first protective shield, a second conduit, a second insulation part and a second protective shield. Cryogenic liquid flows through the first conduit. The first insulation part surrounds the first conduit and has a multi-layered film structure. Film layers of the multi-layered film structure are spaced apart from each other. The first protective shield is formed with a predetermined thickness and diameter to surround the exterior of the first insulation part. Coolant for cooling the first protective shield flows through the second conduit. The second conduit is in contact with the first protective shield. The second insulation part surrounds the first protective shield and the second conduit, and has the multi-layered film structure. The second protective shield is formed with a predetermined thickness and diameter to surround the exterior of the second insulation part.
    Type: Grant
    Filed: July 14, 2016
    Date of Patent: October 30, 2018
    Assignee: KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventor: Jhinhwan Lee
  • Publication number: 20170155363
    Abstract: An amplifier circuit and a method of recovering an input signal in the amplifier circuit are provided. The amplifier circuit may recover an input signal by using a time constant and an output signal of a signal amplifier which is delayed by a certain period, based on characteristics of an inverse Laplace transform of a transfer function of the signal amplifier. A time required for recovering the input signal may be shorter than the time constant of the signal amplifier.
    Type: Application
    Filed: November 30, 2016
    Publication date: June 1, 2017
    Applicants: SAMSUNG ELECTRONICS CO., KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Insu JEON, Jhinhwan LEE, Hwansoo SUH
  • Patent number: 9581617
    Abstract: Plural AFM probes with different resolutions are implemented on an apparatus for scanning a nearly free-standing nanometer-scale specimen. The apparatus identifies the location and the shape of the nano structure on a specimen piece using a high resolution AFM probe, and then measures a three-dimensional shape of the identified nano structure using an atomic resolution AFM probe.
    Type: Grant
    Filed: December 28, 2015
    Date of Patent: February 28, 2017
    Assignee: Korea Advanced Institute of Science and Technology
    Inventors: Jhinhwan Lee, Donghyeon Son
  • Publication number: 20160319982
    Abstract: A transfer line includes a first conduit, a first insulation part, a first protective shield, a second conduit, a second insulation part and a second protective shield. Cryogenic liquid flows through the first conduit. The first insulation part surrounds the first conduit and has a multi-layered film structure. Film layers of the multi-layered film structure are spaced apart from each other. The first protective shield is formed with a predetermined thickness and diameter to surround the exterior of the first insulation part. Coolant for cooling the first protective shield flows through the second conduit. The second conduit is in contact with the first protective shield. The second insulation part surrounds the first protective shield and the second conduit, and has the multi-layered film structure. The second protective shield is formed with a predetermined thickness and diameter to surround the exterior of the second insulation part.
    Type: Application
    Filed: July 14, 2016
    Publication date: November 3, 2016
    Inventor: Jhinhwan LEE
  • Publication number: 20160231351
    Abstract: Plural AFM probes with different resolutions are implemented on an apparatus for scanning a nearly free-standing nanometer-scale specimen. The apparatus identifies the location and the shape of the nano structure on a specimen piece using a high resolution AFM probe, and then measures a three-dimensional shape of the identified nano structure using an atomic resolution AFM probe.
    Type: Application
    Filed: December 28, 2015
    Publication date: August 11, 2016
    Inventors: Jhinhwan Lee, Donghyeon Son
  • Publication number: 20150323347
    Abstract: A piezoelectric actuator and a method of measuring a motion by using the piezoelectric actuator are provided. The piezoelectric actuator includes: a movable member that is disposed to face the fixed member; a piezoelectric element that is disposed between the fixed member and the movable member, and configured to operate in a shear mode based on input voltages applied to the piezoelectric element and move the movable member relative to the fixed member; and a position sensor that is disposed between the piezoelectric element and the movable member, and configured to measure a motion of the movable member.
    Type: Application
    Filed: April 27, 2015
    Publication date: November 12, 2015
    Applicants: KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY, SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Hwansoo SUH, Insu JEON, Jhinhwan LEE