Abstract: A giant magnetoresistance (GMR) sensor is formed using a self organizing diblock copolymer as an etching mask. The diblock copolymer is deposited over a magnetic layer and is self organized into regions of two discrete thicknesses; higher thickness island regions separated by lower thickness valley regions. After the diblock layer is self organized, an etching of process is performed to remove the polymer material from the valley regions as well as the underlying magnetic material. After etching, a patterned magnetic thin film of submicron islands of magnetic material, preferably having a diameter in the single domain range, remain under the mesa region. The islands are interconnected by a non-magnetic, conductive layer with electrical contacts coupled thereto to complete the GMR sensor. When the sensor is not subjected to a magnetic field, the magnetic alignment of the islands is random, and electron scattering results in a high resistance state.

Abstract: A giant magnetoresistance (GMR) sensor is formed using a self organizing diblock copolymer as an etching mask. The diblock copolymer is deposited over a magnetic layer and is self organized into regions of two discrete thicknesses; higher thickness island regions separated by lower thickness valley regions. After the diblock layer is self organized, an etching of process is performed to remove the polymer material from the valley regions as well as the underlying magnetic material. After etching, a patterned magnetic thin film of submicron islands of magnetic material, preferably having a diameter in the single domain range, remain under the mesa region. The islands are interconnected by a non-magnetic, conductive layer with electrical contacts coupled thereto to complete the GMR sensor. When the sensor is not subjected to a magnetic field, the magnetic alignment of the islands is random, and electron scattering results in a high resistance state.

Abstract: A reactive ion beam etching method which employs an oxidizing agent in a plasma contained in an ion source to control carbonaceous deposit (e.g., polymer) formation within the ion source and on the substrate. During operation of an ion source, after operating the ion source with a plasma having a carbonaceous deposit forming species, a plasma containing an oxidizing agent (species) is generated within the ion source. Preferably, within the ion source a plasma is maintained essentially continuously between the time that the carbonaceous deposit forming species is present and the time that the oxidizing agent is present. A reactive ion beam extracted from an ion source containing a plasma having an oxidizing species may be impinged onto a sample substrate to remove (i.e., etch) any carbonaceous material deposits (e.g., polymers) formed on the sample, such as may be formed from previous reactive ion beam etching (RIBE) processing steps using an ion beam having species which may form carbonaceous (e.g.